Inventor
WEST BURNELL G
US35 patents
⚠️ This page may combine multiple inventors who share the name “WEST BURNELL G”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CREDENCE SYSTEMS CORP
14 patentsUS7761751B1Jul 20, 2010
Test and diagnosis of semiconductors
CREDENCE SYSTEMS CORP19 citations92
US7113886B2Sep 26, 2006
Circuit and method for distributing events in an event stream
CREDENCE SYSTEMS CORP20 citations92
US6937006B2Aug 30, 2005
Pin electronics interface circuit
CREDENCE SYSTEMS CORP20 citations92
US6859902B1Feb 22, 2005
Method and apparatus for high speed IC test interface
CREDENCE SYSTEMS CORP36 citations91
US7765443B1Jul 27, 2010
Test systems and methods for integrated circuit devices
CREDENCE SYSTEMS CORP28 citations90
US7035755B2Apr 25, 2006
Circuit testing with ring-connected test instrument modules
CREDENCE SYSTEMS CORP24 citations88
US7222280B1May 22, 2007
Diagnostic process for automated test equipment
CREDENCE SYSTEMS CORP20 citations86
US7017091B2Mar 21, 2006
Test system formatters configurable for multiple data rates
CREDENCE SYSTEMS CORP9 citations74
US7454678B2Nov 18, 2008
Scan stream sequencing for testing integrated circuits
CREDENCE SYSTEMS CORP7 citations72
US7143326B2Nov 28, 2006
Test system algorithmic program generators
CREDENCE SYSTEMS CORP10 citations68
US7336066B2Feb 26, 2008
Reduced pin count test method and apparatus
CREDENCE SYSTEMS CORP3 citations63
US6928387B1Aug 9, 2005
Circuit and method for distributing events in an event stream
CREDENCE SYSTEMS CORP3 citations63
US7171598B2Jan 30, 2007
Tester system having a multi-purpose memory
CREDENCE SYSTEMS CORP5 citations61
US7212941B2May 1, 2007
Non-deterministic protocol packet testing
CREDENCE SYSTEMS CORP4 citations55
SCHLUMBERGER TECHNOLOGIES INC
7 patentsUS5475624ADec 12, 1995
Test generation by environment emulation
SCHLUMBERGER TECHNOLOGIES INC138 citations98
US6128754AOct 3, 2000
Tester having event generation circuit for acquiring waveform by supplying strobe events for waveform acquisition rather than using strobe events specified by the test program
SCHLUMBERGER TECHNOLOGIES INC29 citations92
US6081484AJun 27, 2000
Measuring signals in a tester system
SCHLUMBERGER TECHNOLOGIES INC24 citations92
US7093177B2Aug 15, 2006
Low-jitter clock for test system
SCHLUMBERGER TECHNOLOGIES INC35 citations91
US5430400AJul 4, 1995
Driver circuits for IC tester
SCHLUMBERGER TECHNOLOGIES INC56 citations90
US6014764AJan 11, 2000
Providing test vectors with pattern chaining definition
SCHLUMBERGER TECHNOLOGIES INC22 citations88
US6285963B1Sep 4, 2001
Measuring signals in a tester system
SCHLUMBERGER TECHNOLOGIES INC10 citations74
DYNA LOGIC CORP
3 patentsUS5397943AMar 14, 1995
Clock distribution method and apparatus for high speed circuits with low skew using counterpropaging true and complement re-generated clock signals with predetermined ramp shapes
DYNA LOGIC CORP78 citations96
US5570059AOct 29, 1996
BiCMOS multiplexers and crossbar switches
DYNA LOGIC CORP16 citations82
US5406133AApr 11, 1995
BICMOS reprogrammable logic
DYNA LOGIC CORP17 citations82