Inventor
HUANG WU-SONG
US94 patents
⚠️ This page may combine multiple inventors who share the name “HUANG WU-SONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
37 patentsUS6730454B2May 4, 2004
Antireflective SiO-containing compositions for hardmask layer
IBM112 citations98
US6420088B1Jul 16, 2002
Antireflective silicon-containing compositions as hardmask layer
IBM214 citations98
US6503692B2Jan 7, 2003
Antireflective silicon-containing compositions as hardmask layer
IBM85 citations97
US6420084B1Jul 16, 2002
Mask-making using resist having SIO bond-containing polymer
IBM83 citations97
US5198153AMar 30, 1993
Electrically conductive polymeric
IBM232 citations97
US6338934B1Jan 15, 2002
Hybrid resist based on photo acid/photo base blending
IBM126 citations96
US6043003AMar 28, 2000
E-beam application to mask making using new improved KRS resist system
IBM45 citations96
US6037097AMar 14, 2000
E-beam application to mask making using new improved KRS resist system
IBM50 citations96
US5300208AApr 5, 1994
Fabrication of printed circuit boards using conducting polymer
IBM108 citations96
US5062896ANov 5, 1991
Solder/polymer composite paste and method
IBM96 citations96
US5712078AJan 27, 1998
High contrast photoresists comprising acid sensitive crosslinked polymeric resins
IBM79 citations94
US5609989AMar 11, 1997
Acid scavengers for use in chemically amplified photoresists
IBM47 citations94
US7141692B2Nov 28, 2006
Molecular photoresists containing nonpolymeric silsesquioxanes
IBM19 citations93
US6939664B2Sep 6, 2005
Low-activation energy silicon-containing resist system
IBM30 citations93
US6200726B1Mar 13, 2001
Optimization of space width for hybrid photoresist
IBM33 citations93
US7862982B2Jan 4, 2011
Chemical trim of photoresist lines by means of a tuned overcoat material
IBM21 citations92
US6653045B2Nov 25, 2003
Radiation sensitive silicon-containing negative resists and use thereof
IBM15 citations92
US6103447AAug 15, 2000
Approach to formulating irradiation sensitive positive resists
IBM25 citations92
US6245492B1Jun 12, 2001
Photoresist system and process for aerial image enhancement
IBM32 citations91
US5202061AApr 13, 1993
Electrically conductive polymeric materials and uses thereof
IBM50 citations91
US5200112AApr 6, 1993
Electrically conductive polymeric materials and uses thereof
IBM45 citations91
US7270931B2Sep 18, 2007
Silicon-containing compositions for spin-on ARC/hardmask materials
IBM15 citations90
US6543617B2Apr 8, 2003
Packaged radiation sensitive coated workpiece process for making and method of storing same
IBM16 citations90
US9337033B1May 10, 2016
Dielectric tone inversion materials
IBM9 citations84
US9281212B1Mar 8, 2016
Dielectric tone inversion materials
IBM6 citations84
US8999625B2Apr 7, 2015
Silicon-containing antireflective coatings including non-polymeric silsesquioxanes
IBM8 citations84
US7838198B2Nov 23, 2010
Photoresist compositions and method for multiple exposures with multiple layer resist systems
IBM14 citations84
US7838200B2Nov 23, 2010
Photoresist compositions and method for multiple exposures with multiple layer resist systems
IBM17 citations84
US7709187B2May 4, 2010
High resolution imaging process using an in-situ image modifying layer
IBM8 citations82
US7090963B2Aug 15, 2006
Process for forming features of 50 nm or less half-pitch with chemically amplified resist imaging
IBM16 citations80
US5667938ASep 16, 1997
Acid scavengers for use in chemically amplified photoresists
IBM15 citations80
US5733705AMar 31, 1998
Acid Scavengers for use in chemically amplified photoresists
IBM13 citations78
US6821718B2Nov 23, 2004
Radiation sensitive silicon-containing negative resists and use thereof
IBM10 citations74
US6689540B2Feb 10, 2004
Polymers and use thereof
IBM7 citations74
US6641971B2Nov 4, 2003
Resist compositions comprising silyl ketals and methods of use thereof
IBM8 citations74
US6268436B1Jul 31, 2001
Approach to formulating irradiation sensitive positive resists
IBM9 citations71
US7560222B2Jul 14, 2009
Si-containing polymers for nano-pattern device fabrication
IBM7 citations70
CHEN KUANG-JUNG
4 patentsUS8227307B2Jul 24, 2012
Method for removing threshold voltage adjusting layer with external acid diffusion process
CHEN KUANG-JUNG101 citations98
US8236476B2Aug 7, 2012
Multiple exposure photolithography methods and photoresist compositions
CHEN KUANG-JUNG7 citations84
US8999624B2Apr 7, 2015
Developable bottom antireflective coating composition and pattern forming method using thereof
CHEN KUANG-JUNG5 citations83
US8715907B2May 6, 2014
Developable bottom antireflective coating compositions for negative resists
CHEN KUANG-JUNG4 citations73
SHIPLEY CO LLC
2 patentsINTERNAT BUSINESS MACHINES MAC
1 patentIBM CORP OF ARMONK
1 patentSHINETSU CHEMICAL CO
1 patentHUANG WU-SONG
1 patentGLODDE MARTIN
1 patentBURNS SEAN DAVID
1 patentGLOBALFOUNDRIES INC
1 patentShowing the top 50 of 94 patents by PatentIndex Score.