P

Inventor

HUANG WU-SONG

US94 patents
⚠️ This page may combine multiple inventors who share the name “HUANG WU-SONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

37 patents
US6730454B2May 4, 2004

Antireflective SiO-containing compositions for hardmask layer

IBM112 citations98
US6420088B1Jul 16, 2002

Antireflective silicon-containing compositions as hardmask layer

IBM214 citations98
US6503692B2Jan 7, 2003

Antireflective silicon-containing compositions as hardmask layer

IBM85 citations97
US6420084B1Jul 16, 2002

Mask-making using resist having SIO bond-containing polymer

IBM83 citations97
US5198153AMar 30, 1993

Electrically conductive polymeric

IBM232 citations97
US6338934B1Jan 15, 2002

Hybrid resist based on photo acid/photo base blending

IBM126 citations96
US6043003AMar 28, 2000

E-beam application to mask making using new improved KRS resist system

IBM45 citations96
US6037097AMar 14, 2000

E-beam application to mask making using new improved KRS resist system

IBM50 citations96
US5300208AApr 5, 1994

Fabrication of printed circuit boards using conducting polymer

IBM108 citations96
US5062896ANov 5, 1991

Solder/polymer composite paste and method

IBM96 citations96
US5712078AJan 27, 1998

High contrast photoresists comprising acid sensitive crosslinked polymeric resins

IBM79 citations94
US5609989AMar 11, 1997

Acid scavengers for use in chemically amplified photoresists

IBM47 citations94
US7141692B2Nov 28, 2006

Molecular photoresists containing nonpolymeric silsesquioxanes

IBM19 citations93
US6939664B2Sep 6, 2005

Low-activation energy silicon-containing resist system

IBM30 citations93
US6200726B1Mar 13, 2001

Optimization of space width for hybrid photoresist

IBM33 citations93
US7862982B2Jan 4, 2011

Chemical trim of photoresist lines by means of a tuned overcoat material

IBM21 citations92
US6653045B2Nov 25, 2003

Radiation sensitive silicon-containing negative resists and use thereof

IBM15 citations92
US6103447AAug 15, 2000

Approach to formulating irradiation sensitive positive resists

IBM25 citations92
US6245492B1Jun 12, 2001

Photoresist system and process for aerial image enhancement

IBM32 citations91
US5202061AApr 13, 1993

Electrically conductive polymeric materials and uses thereof

IBM50 citations91
US5200112AApr 6, 1993

Electrically conductive polymeric materials and uses thereof

IBM45 citations91
US7270931B2Sep 18, 2007

Silicon-containing compositions for spin-on ARC/hardmask materials

IBM15 citations90
US6543617B2Apr 8, 2003

Packaged radiation sensitive coated workpiece process for making and method of storing same

IBM16 citations90
US9337033B1May 10, 2016

Dielectric tone inversion materials

IBM9 citations84
US9281212B1Mar 8, 2016

Dielectric tone inversion materials

IBM6 citations84
US8999625B2Apr 7, 2015

Silicon-containing antireflective coatings including non-polymeric silsesquioxanes

IBM8 citations84
US7838198B2Nov 23, 2010

Photoresist compositions and method for multiple exposures with multiple layer resist systems

IBM14 citations84
US7838200B2Nov 23, 2010

Photoresist compositions and method for multiple exposures with multiple layer resist systems

IBM17 citations84
US7709187B2May 4, 2010

High resolution imaging process using an in-situ image modifying layer

IBM8 citations82
US7090963B2Aug 15, 2006

Process for forming features of 50 nm or less half-pitch with chemically amplified resist imaging

IBM16 citations80
US5667938ASep 16, 1997

Acid scavengers for use in chemically amplified photoresists

IBM15 citations80
US5733705AMar 31, 1998

Acid Scavengers for use in chemically amplified photoresists

IBM13 citations78
US6821718B2Nov 23, 2004

Radiation sensitive silicon-containing negative resists and use thereof

IBM10 citations74
US6689540B2Feb 10, 2004

Polymers and use thereof

IBM7 citations74
US6641971B2Nov 4, 2003

Resist compositions comprising silyl ketals and methods of use thereof

IBM8 citations74
US6268436B1Jul 31, 2001

Approach to formulating irradiation sensitive positive resists

IBM9 citations71
US7560222B2Jul 14, 2009

Si-containing polymers for nano-pattern device fabrication

IBM7 citations70

CHEN KUANG-JUNG

4 patents

SHIPLEY CO LLC

2 patents

INTERNAT BUSINESS MACHINES MAC

1 patent

IBM CORP OF ARMONK

1 patent

SHINETSU CHEMICAL CO

1 patent

HUANG WU-SONG

1 patent

GLODDE MARTIN

1 patent

BURNS SEAN DAVID

1 patent

GLOBALFOUNDRIES INC

1 patent

Showing the top 50 of 94 patents by PatentIndex Score.