Inventor
FUKASAWA NORIO
JP32 patents
⚠️ This page may combine multiple inventors who share the name “FUKASAWA NORIO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FUJITSU LTD
18 patentsUS6881611B1Apr 19, 2005
Method and mold for manufacturing semiconductor device, semiconductor device and method for mounting the device
FUJITSU LTD85 citations98
US6455920B2Sep 24, 2002
Semiconductor device having a ball grid array and a fabrication process thereof
FUJITSU LTD72 citations96
US7064047B2Jun 20, 2006
Semiconductor device having a ball grid array and a fabrication process thereof
FUJITSU LTD16 citations92
US6987054B2Jan 17, 2006
Method of fabricating a semiconductor device having a groove formed in a resin layer
FUJITSU LTD12 citations92
US6784542B2Aug 31, 2004
Semiconductor device having a ball grid array and a fabrication process thereof
FUJITSU LTD15 citations92
US6657282B2Dec 2, 2003
Semiconductor device having a ball grid array and a fabrication process thereof
FUJITSU LTD19 citations92
US6511620B1Jan 28, 2003
Method of producing semiconductor devices having easy separability from a metal mold after molding
FUJITSU LTD35 citations92
US6507092B1Jan 14, 2003
Semiconductor device having increased reliability and method of producing the same and semiconductor chip suitable for such a semiconductor device and method of producing the same
FUJITSU LTD21 citations92
US6471501B1Oct 29, 2002
Mold for fabricating semiconductor devices
FUJITSU LTD53 citations92
US6469370B1Oct 22, 2002
Semiconductor device and method of production of the semiconductor device
FUJITSU LTD54 citations92
US6437432B2Aug 20, 2002
Semiconductor device having improved electrical characteristics and method of producing the same
FUJITSU LTD30 citations92
US6333638B1Dec 25, 2001
Semiconductor test apparatus and test method using the same
FUJITSU LTD29 citations91
US6246249B1Jun 12, 2001
Semiconductor inspection apparatus and inspection method using the apparatus
FUJITSU LTD38 citations91
US5767528AJun 16, 1998
Semiconductor device including pad portion for testing
FUJITSU LTD46 citations91
US6013944AJan 11, 2000
Semiconductor device in which chip electrodes are connected to terminals arranged along the periphery of an insulative board
FUJITSU LTD34 citations89
US6515347B1Feb 4, 2003
Wafer level semiconductor device and method of manufacturing the same
FUJITSU LTD7 citations73
US6518784B2Feb 11, 2003
Test method using semiconductor test apparatus
FUJITSU LTD6 citations72
US6388461B2May 14, 2002
Semiconductor inspection apparatus and inspection method using the apparatus
FUJITSU LTD2 citations61
SONY CORP
8 patentsUS6188528B1Feb 13, 2001
Optical lens, and optical pickup and optical disc apparatus using such lens
SONY CORP9 citations74
US7345982B2Mar 18, 2008
Optical pickup device, optical disk drive, optical device and composite optical element
SONY CORP2 citations63
US7064900B2Jun 20, 2006
Optical pickup device and optical disk device and optical device and composite optical element
SONY CORP3 citations63
US6987614B2Jan 17, 2006
Optical pickup and optical disc drive device
SONY CORP3 citations63
US8357620B2Jan 22, 2013
Laser annealing method and laser annealing apparatus
SONY CORP3 citations60
US7180668B2Feb 20, 2007
Optical pickup device and optical disc device
SONY CORP0 citations52
US7616548B2Nov 10, 2009
Optical pickup apparatus and optical disc apparatus
SONY CORP0 citations42
US7248544B2Jul 24, 2007
Optical head and recording and/or reproducing apparatus employing same
SONY CORP0 citations40