Inventor
CHO WOO-YEONG
KR111 patents
⚠️ This page may combine multiple inventors who share the name “CHO WOO-YEONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
45 patentsUS7808815B2Oct 5, 2010
Variable resistance memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD72 citations98
US7570511B2Aug 4, 2009
Semiconductor memory device having a three-dimensional cell array structure
SAMSUNG ELECTRONICS CO LTD80 citations98
US7542356B2Jun 2, 2009
Semiconductor memory device and method for reducing cell activation during write operations
SAMSUNG ELECTRONICS CO LTD76 citations98
US7529124B2May 5, 2009
Phase change memory devices and systems, and related programming methods
SAMSUNG ELECTRONICS CO LTD77 citations98
US7190607B2Mar 13, 2007
Phase-change memory element driver circuits using measurement to control current and methods of controlling drive current of phase-change memory elements using measurement
SAMSUNG ELECTRONICS CO LTD78 citations98
US7085154B2Aug 1, 2006
Device and method for pulse width control in a phase change memory device
SAMSUNG ELECTRONICS CO LTD82 citations98
US6982913B2Jan 3, 2006
Data read circuit for use in a semiconductor memory and a memory thereof
SAMSUNG ELECTRONICS CO LTD73 citations98
US7304885B2Dec 4, 2007
Phase change memories and/or methods of programming phase change memories using sequential reset control
SAMSUNG ELECTRONICS CO LTD33 citations96
US7012834B2Mar 14, 2006
Writing driver circuit of phase-change memory
SAMSUNG ELECTRONICS CO LTD53 citations96
US6943395B2Sep 13, 2005
Phase random access memory with high density
SAMSUNG ELECTRONICS CO LTD45 citations96
US6885602B2Apr 26, 2005
Programming method of controlling the amount of write current applied to phase change memory device and write driver circuit therefor
SAMSUNG ELECTRONICS CO LTD64 citations95
US7920405B2Apr 5, 2011
Circuits and methods for adaptive write bias driving of resistive non-volatile memory devices
SAMSUNG ELECTRONICS CO LTD34 citations93
US7903448B2Mar 8, 2011
Resistance random access memory having common source line
SAMSUNG ELECTRONICS CO LTD31 citations93
US7894236B2Feb 22, 2011
Nonvolatile memory devices that utilize read/write merge circuits
SAMSUNG ELECTRONICS CO LTD24 citations93
US7688621B2Mar 30, 2010
Memory system, memory device and apparatus including writing driver circuit for a variable resistive memory
SAMSUNG ELECTRONICS CO LTD26 citations93
US7639522B2Dec 29, 2009
Method of driving multi-level variable resistive memory device and multi-level variable resistive memory device
SAMSUNG ELECTRONICS CO LTD34 citations93
US7633788B2Dec 15, 2009
Variable resistive memory wordline switch
SAMSUNG ELECTRONICS CO LTD16 citations93
US7548451B2Jun 16, 2009
Phase change random access memory
SAMSUNG ELECTRONICS CO LTD24 citations93
US7535747B2May 19, 2009
Phase change random access memory and related methods of operation
SAMSUNG ELECTRONICS CO LTD21 citations93
US7463509B2Dec 9, 2008
Magneto-resistive RAM having multi-bit cell array structure
SAMSUNG ELECTRONICS CO LTD19 citations93
US7457151B2Nov 25, 2008
Phase change random access memory (PRAM) device having variable drive voltages
SAMSUNG ELECTRONICS CO LTD21 citations93
US7450415B2Nov 11, 2008
Phase-change memory device
SAMSUNG ELECTRONICS CO LTD24 citations93
US7315469B2Jan 1, 2008
Control of set/reset pulse in response to peripheral temperature in PRAM device
SAMSUNG ELECTRONICS CO LTD21 citations93
US7283387B2Oct 16, 2007
Phase change random access memory device having variable drive voltage circuit
SAMSUNG ELECTRONICS CO LTD44 citations93
US7245526B2Jul 17, 2007
Phase change memory device providing compensation for leakage current
SAMSUNG ELECTRONICS CO LTD34 citations93
US7242605B2Jul 10, 2007
Phase-change memory device and method that maintains the resistance of a phase-change material in a reset state within a constant resistance range
SAMSUNG ELECTRONICS CO LTD26 citations93
US7064601B2Jun 20, 2006
Reference voltage generating circuit using active resistance device
SAMSUNG ELECTRONICS CO LTD36 citations93
US6982908B2Jan 3, 2006
Magnetic random access memory device capable of providing a constant current to a reference cell
SAMSUNG ELECTRONICS CO LTD39 citations93
US7656719B2Feb 2, 2010
Phase change memory device generating program current and method thereof
SAMSUNG ELECTRONICS CO LTD14 citations92
US7582941B2Sep 1, 2009
Magnetic memory device and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD14 citations92
US7522449B2Apr 21, 2009
Phase change memory device and related programming method
SAMSUNG ELECTRONICS CO LTD35 citations92
US7447092B2Nov 4, 2008
Write driver circuit for controlling a write current applied to a phase change memory based on an ambient temperature
SAMSUNG ELECTRONICS CO LTD15 citations92
US7427531B2Sep 23, 2008
Phase change memory devices employing cell diodes and methods of fabricating the same
SAMSUNG ELECTRONICS CO LTD27 citations92
US7391644B2Jun 24, 2008
Phase-changeable memory device and read method thereof
SAMSUNG ELECTRONICS CO LTD29 citations92
US7180771B2Feb 20, 2007
Device and method for pulse width control in a phase change memory device
SAMSUNG ELECTRONICS CO LTD34 citations92
US7746688B2Jun 29, 2010
PRAM and method of firing memory cells
SAMSUNG ELECTRONICS CO LTD20 citations91
US7952956B2May 31, 2011
Variable resistance memory device and system
SAMSUNG ELECTRONICS CO LTD15 citations84
US7924639B2Apr 12, 2011
Nonvolatile memory device using resistance material
SAMSUNG ELECTRONICS CO LTD13 citations84
US7869256B2Jan 11, 2011
Bi-directional resistive random access memory capable of multi-decoding and method of writing data thereto
SAMSUNG ELECTRONICS CO LTD7 citations84
US7843715B2Nov 30, 2010
Memory cell of a resistive semiconductor memory device, a resistive semiconductor memory device having a three-dimensional stack structure, and related methods
SAMSUNG ELECTRONICS CO LTD11 citations84
US7843716B2Nov 30, 2010
Nonvolatile memory device having memory and reference cells
SAMSUNG ELECTRONICS CO LTD11 citations84
US7817465B2Oct 19, 2010
Phase change random access memory
SAMSUNG ELECTRONICS CO LTD9 citations84
US7586776B2Sep 8, 2009
Nonvolatile memory devices having multi-filament variable resistivity memory cells therein
SAMSUNG ELECTRONICS CO LTD10 citations84
US7580295B2Aug 25, 2009
Semiconductor memory device and memory system including semiconductor memory device
SAMSUNG ELECTRONICS CO LTD8 citations84
US7548467B2Jun 16, 2009
Bias voltage generator and method generating bias voltage for semiconductor memory device
SAMSUNG ELECTRONICS CO LTD14 citations84
CHO WOO-YEONG
3 patentsUS8159867B2Apr 17, 2012
Phase change memory devices and systems, and related programming methods
CHO WOO-YEONG49 citations97
US8116117B2Feb 14, 2012
Method of driving multi-level variable resistive memory device and multi-level variable resistive memory device
CHO WOO-YEONG22 citations92
US8116127B2Feb 14, 2012
Phase change memory devices and systems, and related programming methods
CHO WOO-YEONG24 citations92
BAE JUN-SOO
1 patentBAE JUNSOO
1 patentShowing the top 50 of 111 patents by PatentIndex Score.