Inventor
PASTEL LEAH M P
US20 patents
⚠️ This page may combine multiple inventors who share the name “PASTEL LEAH M P”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
19 patentsUS7139950B2Nov 21, 2006
Segmented scan chains with dynamic reconfigurations
IBM58 citations96
US7247877B2Jul 24, 2007
Integrated carbon nanotube sensors
IBM24 citations92
US6880136B2Apr 12, 2005
Method to detect systematic defects in VLSI manufacturing
IBM29 citations92
US7194706B2Mar 20, 2007
Designing scan chains with specific parameter sensitivities to identify process defects
IBM24 citations91
US7484423B2Feb 3, 2009
Integrated carbon nanotube sensors
IBM12 citations84
US7093213B2Aug 15, 2006
Method for designing an integrated circuit defect monitor
IBM11 citations84
US8015514B2Sep 6, 2011
Random personalization of chips during fabrication
IBM14 citations83
US6998866B1Feb 14, 2006
Circuit and method for monitoring defects
IBM13 citations83
US7005874B2Feb 28, 2006
Utilizing clock shield as defect monitor
IBM7 citations73
US7064570B2Jun 20, 2006
Method for locating IDDQ defects using multiple controlled collapse chip connections current measurement on an automatic tester
IBM5 citations72
US6677774B2Jan 13, 2004
Method for locating IDDQ defects using multiple controlled collapse chip connections current measurement on an automatic tester
IBM8 citations72
US7202689B2Apr 10, 2007
Sensor differentiated fault isolation
IBM8 citations71
US6675323B2Jan 6, 2004
Incremental fault dictionary
IBM8 citations70
US8347260B2Jan 1, 2013
Method of designing an integrated circuit based on a combination of manufacturability, test coverage and, optionally, diagnostic coverage
IBM2 citations63
US7088124B2Aug 8, 2006
Utilizing clock shield as defect monitor
IBM3 citations62
US7089138B1Aug 8, 2006
Canary device for failure analysis
IBM5 citations62
US7428675B2Sep 23, 2008
Testing using independently controllable voltage islands
IBM5 citations59
US7239167B2Jul 3, 2007
Utilizing clock shield as defect monitor
IBM0 citations52
US7089514B2Aug 8, 2006
Defect diagnosis for semiconductor integrated circuits
IBM1 citations48