Inventor · disambiguated record
Brian Trapp
Also filed as: TRAPP BRIAN · TRAPP BRIAN M
5 granted patents·3 pending applications·27 citations·filing 2003–2009
72Inventor score
Top patents by PatentIndex Score
8 records- 0185US7752581B2Design structure and system for identification of defects on circuits or other arrayed productsIBM·Filed 2007·Granted Jul 6, 2010·17 cites·25 claims
- 0265US7346470B2System for identification of defects on circuits or other arrayed productsIBM·Filed 2003·Granted Mar 18, 2008·10 cites·22 claims
- 0350US2008148201A1Design Structure and System for Identification of Defects on Circuits or Other Arrayed ProductsIBM·Filed 2008·Application pending·0 cites
- 0449US2009112352A1Equivalent gate count yield estimation for integrated circuit devicesIBM·Filed 2009·Application pending·0 cites
- 0547US2006265185A1System for identification of defects on circuits or other arrayed productsIBM·Filed 2006·Application pending·0 cites
- 0644US7477961B2Equivalent gate count yield estimation for integrated circuit devicesIBM·Filed 2006·Granted Jan 13, 2009·0 cites·4 claims
- 0740US8429193B2Security control of analysis resultsSONG YUNSHENG·Filed 2009·Granted Apr 23, 2013·0 cites·20 claims
- 0838US7751920B2Method and system of data weighted object orientation for data miningIBM·Filed 2006·Granted Jul 6, 2010·0 cites·17 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →