Inventor
NAGAKUBO YASUHIRA
JP19 patents
⚠️ This page may combine multiple inventors who share the name “NAGAKUBO YASUHIRA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
11 patentsUS9721752B2Aug 1, 2017
Sample holder and charged particle device
HITACHI HIGH TECH CORP3 citations73
US10068745B2Sep 4, 2018
Charged particle beam device and sample holder for charged particle beam device
HITACHI HIGH TECH CORP3 citations72
US9558910B2Jan 31, 2017
Sample holder for electron microscope
HITACHI HIGH TECH CORP3 citations72
US10083814B2Sep 25, 2018
Electron microscope and sample observation method
HITACHI HIGH TECH CORP2 citations71
US10204761B2Feb 12, 2019
Charged particle beam device, electron microscope and sample observation method
HITACHI HIGH TECH CORP2 citations70
US11177109B2Nov 16, 2021
Specimen holder and charged particle beam device provided with same
HITACHI HIGH TECH CORP0 citations62
US10658150B2May 19, 2020
Cryostation system
HITACHI HIGH TECH CORP1 citations62
US7700927B2Apr 20, 2010
Heating stage for a micro-sample
HITACHI HIGH TECH CORP5 citations59
US9449786B2Sep 20, 2016
Charged particle radiation device and specimen preparation method using said device
HITACHI HIGH TECH CORP1 citations51
US9378922B2Jun 28, 2016
Electron microscope and electron microscope sample retaining device
HITACHI HIGH TECH CORP0 citations51
US9543112B2Jan 10, 2017
Specimen cryo holder and dewar
HITACHI HIGH TECH CORP0 citations34
NAGAKUBO YASUHIRA
4 patentsUS8853648B2Oct 7, 2014
Sample holder, method for use of the sample holder, and charged particle device
NAGAKUBO YASUHIRA5 citations70
US8729497B2May 20, 2014
Sample device for charged particle beam
NAGAKUBO YASUHIRA4 citations68
USD660335SMay 22, 2012
Fixation device for a sample case for an electron microscope
NAGAKUBO YASUHIRA3 citations57
USD651226SDec 27, 2011
Sample case for an electron microscope
NAGAKUBO YASUHIRA4 citations57
YAGUCHI TOSHIE
3 patentsUS8878144B2Nov 4, 2014
Electron microscope and sample holder
YAGUCHI TOSHIE9 citations81
US8604429B2Dec 10, 2013
Electron beam device and sample holding device for electron beam device
YAGUCHI TOSHIE7 citations81
US9099281B2Aug 4, 2015
Charged particle radiation apparatus, and method for displaying three-dimensional information in charged particle radiation apparatus
YAGUCHI TOSHIE1 citations49