Inventor

HONDA TOSHIFUMI

JP113 patents

⚠️ This page may combine multiple inventors who share the name “HONDA TOSHIFUMI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HONDA TOSHIFUMI

HITACHI HIGH TECH CORP

Defect classifier using classification recipe based on connection between rule-based and example-based classifiers

Method of classifying defects using multiple inspection machines

SEM-type reviewing apparatus and a method for reviewing defects using the same

Defect inspection method

Method of observing a specimen using a scanning electron microscope

Defect inspection device and defect inspection method

Defect observation method and device therefor

Method and apparatus for displaying detected defects

Method and apparatus for reviewing defects of semiconductor device

Apparatus and method for classifying defects using multiple classification modules

Scanning electron microscope and system for inspecting semiconductor device

Method and apparatus of reviewing defects on a semiconductor device

Defect classification using a logical equation for high stage classification

Defect inspection method

Defect review method and device for semiconductor device

Method and apparatus for reviewing defects

Method and apparatus for reviewing defects by detecting images having voltage contrast

Defect inspection method and defect inspection device

Observing method and its apparatus using electron microscope

Defect inspection apparatus and defect inspection method

Defect observation method and device and defect detection device

Defect inspection device and defect inspection method

Defect inspection method and its device

Method and device for detecting defects and method and device for observing defects

Method and apparatus for inspecting defects

Defect inspection device and defect inspection method

Defect inspection device and defect inspection method

Defect inspection device and defect inspection method

Defect inspection method and its device

X-ray inspection device, inspection method, and X-ray detector

Defect inspection method and device using same

HITACHI LTD

Method of reviewing detected defects

Defect inspection apparatus and defect inspection method

Method and its apparatus for inspecting a specimen

Solder testing apparatus

Defect judgement processing method and apparatus

Method monitoring a quality of electronic circuits and its manufacturing condition and system for it

Method and its apparatus for classifying defects

Defect inspection apparatus and defect inspection method

Method of reviewing detected defects

NAKAGAKI RYO

Defect classifier using classification recipe based on connection between rule-based and example-based classifiers

Defect classifier using classification recipe based on connection between rule-based and example-based classifiers

URANO YUTA

Defect inspection method and defect inspection apparatus

Defect inspection method, low light detecting method and low light detector

TAKAGI YUJI

Method and device for testing defect using SEM

KURIHARA MASAKI

Method and apparatus for reviewing defects of semiconductor device

HONDA TOSHIFUMI

Apparatus and method for monitoring semiconductor device manufacturing process

NAKAHIRA KENJI

Scanning electron microscope and method for processing an image obtained by the scanning electron microscope

HOSOYA NAOKI

Defect inspection method, and device thereof

URANO TAKAHIRO

Defect inspection device and defect inspection method