Inventor
SARKAR VASKAR
IN3 patents
Patents
3 patentsUS10460821B2Oct 29, 2019
Area efficient parallel test data path for embedded memories
TEXAS INSTRUMENTS INC1 citations58
US12130329B2Oct 29, 2024
Methods and apparatus to implement a boundary scan for shared analog and digital pins
TEXAS INSTRUMENTS INC1 citations54
US9899103B2Feb 20, 2018
Area efficient parallel test data path for embedded memories
TEXAS INSTRUMENTS INC0 citations48