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Inventor
SEONG JUN-SEOG
KR
2 patents
⚠️ This page may combine multiple inventors who share the name “SEONG JUN-SEOG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
JANG HWAN-SEOK
1 patent
US8711348B2
Apr 29, 2014
Method of inspecting wafer
JANG HWAN-SEOK
57 citations
89
SAMSUNG ELECTRONICS CO LTD
1 patent
US8976348B2
Mar 10, 2015
Wafer inspection system
SAMSUNG ELECTRONICS CO LTD
0 citations
47