Inventor
KAEMMER STEFAN B
US2 patents
Patents
2 patentsUS8881311B2Nov 4, 2014
Method and apparatus of physical property measurement using a probe-based nano-localized light source
BRUKER NANO INC10 citations81
US9052336B2Jun 9, 2015
Method and apparatus of physical property measurement using a probe-based nano-localized light source
BRUKER NANO INC1 citations49