Inventor

SAXENA SHARAD

US23 patents

⚠️ This page may combine multiple inventors who share the name “SAXENA SHARAD”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAXENA SHARAD

TEXAS INSTRUMENTS INC

Method of diagnosing malfunctions in semiconductor manufacturing equipment

Controlling process modules using site models and monitor wafer control

Method and system for using response-surface methodologies to determine optimal tuning parameters for complex simulators

Use of spatial models for simultaneous control of various non-uniformity metrics

Multi-variable statistical process controller for discrete manufacturing

Process flow design at the module effects level through the use of acceptability regions

Design of microelectronic process flows for manufacturability and performance

Automated diagnosis using wafer tracking databases

Integrating dual supply voltage by removing the drain extender implant from the high voltage device

Method and apparatus for predicting an operational lifetime of a transistor

Integrating dual supply voltages using a single extra mask level

System and method for non-parametric modeling of processed induced variability

PDF SOLUTIONS INC

Methodology for the optimization of testing and diagnosis of analog and mixed signal ICs and embedded cores

Efficient method for modeling and simulation of the impact of local and global variation on integrated circuits

Method for optimizing the characteristics of integrated circuits components from circuit specifications

Method for reducing layout printability effects on semiconductor device performance

Test structures and method for electrical measurement of FinFET fin height

Method for accurate measurement of leaky capacitors using charge based capacitance measurements

Test structures for measuring silicon thickness in fully depleted silicon-on-insulator technologies

Method for applying charge-based-capacitance-measurement with switches using only NMOS or only PMOS transistors

PDF SOLUTIONS

Systems and methods for detecting and monitoring nickel-silicide process and induced failures

Test structures and methods for measuring silicon thickness in fully depleted silicon-on-insulator technologies

QUARANTELLI MICHELE

Embedded system to characterize BTI degradation effects in MOSFETs