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Inventor
SUNG HA MIN
KR
8 patents
⚠️ This page may combine multiple inventors who share the name “SUNG HA MIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HYNIX SEMICONDUCTOR INC
3 patents
US6711077B2
Mar 23, 2004
Wafer burn-in test and wafer test circuit
HYNIX SEMICONDUCTOR INC
8 citations
71
US6657903B2
Dec 2, 2003
Circuit for generating power-up signal
HYNIX SEMICONDUCTOR INC
11 citations
71
US6570796B2
May 27, 2003
Wafer burn-in test and wafer test circuit
HYNIX SEMICONDUCTOR INC
10 citations
71
LG SEMICON CO LTD
2 patents
US5708607A
Jan 13, 1998
Data read circuit of a memory
LG SEMICON CO LTD
24 citations
92
US6147512A
Nov 14, 2000
Input buffer circuit
LG SEMICON CO LTD
4 citations
62
HYUNDAI ELECTRONICS IND
2 patents
US6281742B1
Aug 28, 2001
Substrate voltage detection control circuit
HYUNDAI ELECTRONICS IND
13 citations
71
US6198344B1
Mar 6, 2001
Back bias voltage level sensing circuit
HYUNDAI ELECTRONICS IND
7 citations
71
SK HYNIX INC
1 patent
US8952735B2
Feb 10, 2015
Integrated circuit
SK HYNIX INC
0 citations
50