Inventor

Lev Uri

IL2 patents

Patents

2 patents

US10347462B2Jul 9, 2019

Imaging of crystalline defects

APPLIED MATERIALS ISRAEL LTD2 citations69

US10541104B2Jan 21, 2020

System and method for scanning an object with an electron beam using overlapping scans and electron beam counter-deflection

APPLIED MATERIALS ISRAEL LTD0 citations31