Inventor

LAI KEN HANH DUC

US4 patents

⚠️ This page may combine multiple inventors who share the name “LAI KEN HANH DUC”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ADVANTEST CORP

2 patents

US9330792B2May 3, 2016

Testing memory devices with distributed processing operations

ADVANTEST CORP3 citations68

US9612272B2Apr 4, 2017

Testing memory devices with parallel processing operations

ADVANTEST CORP0 citations50

AGILENT TECHNOLOGIES INC

1 patent

US6748562B1Jun 8, 2004

Memory tester omits programming of addresses in detected bad columns

AGILENT TECHNOLOGIES INC28 citations90

DE LA PUENTE EDMUNDO

1 patent

US9557372B2Jan 31, 2017

Tester having an application specific electronics module, and systems and methods that incorporate or use the same

DE LA PUENTE EDMUNDO0 citations35