Inventor

DE LA PUENTE EDMUNDO

US19 patents

⚠️ This page may combine multiple inventors who share the name “DE LA PUENTE EDMUNDO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

DE LA PUENTE EDMUNDO

ADVANTEST CORP

Automated test equipment with hardware accelerator

Testing memory devices with distributed processing operations

Method and apparatus for providing UFS terminated and unterminated pulse width modulation support using dual channels

Memory queue operations to increase throughput in an ATE system

Systems and methods of testing devices using CXL for increased parallelism

Testing memory devices with parallel processing operations

VERIGY PTE LTD SINGAPORE

Test system and method for testing electronic devices using a pipelined testing architecture

Systems and methods of allocating device testing resources to sites of a probe card

Resource matrix, system, and method for operating same

Methods and apparatus that selectively use or bypass a remote pin electronics block to test at least one device under test

Methods and apparatus for testing a circuit

AGILENT TECHNOLOGIES INC

Memory tester tests multiple DUT&#39;s per test site

Algorithmically programmable memory tester with test sites operating in a slave mode

Error catch RAM for memory tester has SDRAM memory sets configurable for size and speed

Memory tester uses arbitrary dynamic mappings to serialize vectors into transmitted sub-vectors and de-serialize received sub-vectors into vectors

DE LA PUENTE EDMUNDO

Transmit/receive unit, and methods and apparatus for transmitting signals between transmit/receive units

Tester having an application specific electronics module, and systems and methods that incorporate or use the same

ADVANTEST SINGAPORE PTE LTD

Test system and method for testing electronic devices using a pipelined testing architecture

Parallel test circuit with active devices

Memory tester tests multiple DUT's per test site