Inventor

JIN HONG-JUN

KR2 patents

Patents

2 patents

US12300344B2May 13, 2025

Memory device, memory device test method, and test system

SAMSUNG ELECTRONICS CO LTD0 citations56

US8029292B2Oct 4, 2011

Multi-socket guide and test device comprising the same

SAMSUNG ELECTRONICS CO LTD0 citations38