Inventor

CLARYSSE TRUDO

BE6 patents

⚠️ This page may combine multiple inventors who share the name “CLARYSSE TRUDO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IMEC

3 patents

US8364428B2Jan 29, 2013

Junction-photovoltage method and apparatus for contactless determination of sheet resistance and leakage current of semiconductor

IMEC5 citations63

US7751035B2Jul 6, 2010

Method and device to quantify active carrier profiles in ultra-shallow semiconductor structures

IMEC1 citations47

US8717570B2May 6, 2014

Method for determining the active doping concentration of a doped semiconductor region

IMEC0 citations38

IMEC VZW

1 patent

US5995912ANov 30, 1999

Database and method for measurement correction for cross-sectional carrier profiling techniques

IMEC VZW22 citations87

IMEC INTER UNI MICRO ELECTR

1 patent

US7133128B2Nov 7, 2006

System and method for measuring properties of a semiconductor substrate in a non-destructive way

IMEC INTER UNI MICRO ELECTR6 citations60

CLARYSSE TRUDO

1 patent

US8314628B2Nov 20, 2012

Method and device for the independent extraction of carrier concentration level and electrical junction depth in a semiconductor substrate

CLARYSSE TRUDO3 citations46