Inventor

HAMILTON MICHAEL J

US31 patents

⚠️ This page may combine multiple inventors who share the name “HAMILTON MICHAEL J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HAMILTON MICHAEL J

IBM

Test coverage of integrated circuits with test vector input spreading

Test coverage of integrated circuits with test vector input spreading

Test coverage of integrated circuits with masking pattern selection

Test coverage of integrated circuits with masking pattern selection

Dynamic built-in self-test system

Implementing enhanced diagnostics with intelligent pattern combination in automatic test pattern generation (ATPG)

Multi-core processor comparison encoding

Self evaluation of system on a chip with multiple cores

Partitioned scan chain diagnostics using multiple bypass structures and injection points

Inserting bypass structures at tap points to reduce latch dependency during scan testing

Inserting bypass structures at tap points to reduce latch dependency during scan testing

Partitioned scan chain diagnostics using multiple bypass structures and injection points

Implementing enhanced scan chain diagnostics via bypass multiplexing structure

Implementing enhanced scan chain diagnostics via bypass multiplexing structure

Managing redundancy repair using boundary scans

Managing redundancy repair using boundary scans

Self evaluation of system on a chip with multiple cores

Dynamic built-in self-test system

Minimization of over-masking in an on product multiple input signature register (OPMISR)

Implementing over-masking removal in an on product multiple input signature register (OPMISR) test due to common channel mask scan registers (CMSR) loading

Implementing decreased scan data interdependence in on product multiple input signature register (OPMISR) through PRPG control rotation

Method of and system for functionally testing multiple devices in parallel in a burn-in-environment

Implementing prioritized compressed failure defects for efficient scan diagnostics

Removal of over-masking in an on product multiple input signature register (OPMISR) test

Implementing decreased scan data interdependence for compressed patterns in on product multiple input signature register (OPMISR) through scan skewing

Implementing register array (RA) repair using LBIST

Implementing decreased scan data interdependence for compressed patterns in on product multiple input signature register (OPMISR) through spreading in stumpmux daisy-chain structure

DOUSKEY STEVEN M

Dynamic scan

Implementing enhanced pseudo random pattern generators with hierarchical linear feedback shift registers (LFSRs)

Iimplementing enhanced aperture function calibration for logic built in self test (LBIST)

GLOBALFOUNDRIES INC

Test coverage of integrated circuits with masking pattern selection