Inventor
OSZINDA THOMAS
KR14 patents
⚠️ This page may combine multiple inventors who share the name “OSZINDA THOMAS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
7 patentsUS10867923B2Dec 15, 2020
Semiconductor device
SAMSUNG ELECTRONICS CO LTD2 citations73
US9972528B2May 15, 2018
Semiconductor devices
SAMSUNG ELECTRONICS CO LTD3 citations72
US10128148B2Nov 13, 2018
Methods for fabricating semiconductor devices including surface treatment processes
SAMSUNG ELECTRONICS CO LTD4 citations71
US9653400B2May 16, 2017
Semiconductor device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD5 citations70
US9929098B2Mar 27, 2018
Copper via with barrier layer and cap layer
SAMSUNG ELECTRONICS CO LTD0 citations50
US9576848B2Feb 21, 2017
Method of treating a porous dielectric layer and a method of fabricating a semiconductor device using the same
SAMSUNG ELECTRONICS CO LTD0 citations49
US10096549B2Oct 9, 2018
Semiconductor devices having interconnection structure
SAMSUNG ELECTRONICS CO LTD0 citations40
SCHALLER MATTHIAS
3 patentsUS8575041B2Nov 5, 2013
Repair of damaged surface areas of sensitive low-K dielectrics of microstructure devices after plasma processing by in situ treatment
SCHALLER MATTHIAS1 citations50
US8440579B2May 14, 2013
Re-establishing surface characteristics of sensitive low-k dielectrics in microstructure device by using an in situ surface modification
SCHALLER MATTHIAS1 citations50
US8423320B2Apr 16, 2013
Method and system for quantitative inline material characterization in semiconductor production processes based on structural measurements and related models
SCHALLER MATTHIAS0 citations39