Inventor
TABAKMAN KEITH H
US22 patents
⚠️ This page may combine multiple inventors who share the name “TABAKMAN KEITH H”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
14 patentsUS8361859B2Jan 29, 2013
Stressed transistor with improved metastability
IBM13 citations84
US10262996B2Apr 16, 2019
Third type of metal gate stack for CMOS devices
IBM1 citations73
US10243077B2Mar 26, 2019
FinFET with dielectric isolation after gate module for improved source and drain region epitaxial growth
IBM2 citations73
US9917190B2Mar 13, 2018
FinFET with dielectric isolation after gate module for improved source and drain region epitaxial growth
IBM2 citations73
US9312364B2Apr 12, 2016
finFET with dielectric isolation after gate module for improved source and drain region epitaxial growth
IBM3 citations73
US8815656B2Aug 26, 2014
Semiconductor device and method with greater epitaxial growth on 110 crystal plane
IBM4 citations73
US11081583B2Aug 3, 2021
FinFET with dielectric isolation after gate module for improved source and drain region epitaxial growth
IBM0 citations62
US9059286B2Jun 16, 2015
Pre-gate, source/drain strain layer formation
IBM2 citations62
US8618617B2Dec 31, 2013
Field effect transistor device
IBM3 citations62
US10741554B2Aug 11, 2020
Third type of metal gate stack for CMOS devices
IBM0 citations52
US10615279B2Apr 7, 2020
FinFET with dielectric isolation after gate module for improved source and drain region epitaxial growth
IBM0 citations52
US9634006B2Apr 25, 2017
Third type of metal gate stack for CMOS devices
IBM0 citations52
US9171800B2Oct 27, 2015
Electrical fuse with bottom contacts
IBM0 citations52
US8779525B2Jul 15, 2014
Method for growing strain-inducing materials in CMOS circuits in a gate first flow
IBM0 citations51
GLOBALFOUNDRIES INC
4 patentsUS9812400B1Nov 7, 2017
Contact line having insulating spacer therein and method of forming same
GLOBALFOUNDRIES INC19 citations90
US10635007B1Apr 28, 2020
Apparatus and method for aligning integrated circuit layers using multiple grating materials
GLOBALFOUNDRIES INC11 citations79
US10825811B2Nov 3, 2020
Gate cut first isolation formation with contact forming process mask protection
GLOBALFOUNDRIES INC4 citations72
US10049985B2Aug 14, 2018
Contact line having insulating spacer therein and method of forming same
GLOBALFOUNDRIES INC0 citations50