Inventor

NASU OSAMU

JP54 patents

⚠️ This page may combine multiple inventors who share the name “NASU OSAMU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NASU OSAMU

MITSUBISHI ELECTRIC CORP

Display screen with graphical user interface

Display screen with graphical user interface

Display screen with graphical user interface

Display screen with graphical user interface

Display screen with graphical user interface

Development support device, non-transitory computer-readable medium, and development support method

Data analysis device, system, method, and recording medium storing program

Data processing device, data processing method, setting management device, and data processing system

Machine tool machining dimensions prediction device, machine tool equipment abnormality determination device, machine tool machining dimensions prediction system, and machine tool machining dimensions prediction method

Data delivery control apparatus, method, and program

Data collection apparatus, method, and program

Signal selection device, learning device, and signal selection method and program

Learning processing device, data analysis device, analytical procedure selection method, and recording medium

Learning device, learning method and program

Information processing apparatus and information processing method

Data processing apparatus, method, and recording medium

Data processing device including a data collector to collect data and output information relating to a result of execution of a data processing flow, data processing system, data processing method, and program

Management device, management system, management method, and program for providing virtual and real resource information values

Data processing device, data processing system, data processing method, and program

Information processing device

Data processing device and data processing system

Data management device, data management system, data management method, and program

Position detection device

Absolute encoder

Diagnosis device, diagnosis method and program

Diagnostic device, diagnostic method and program

Time-sequential data diagnosis device, additional learning method, and recording medium

Data processing system, data processing apparatus, and recording medium

Data processing device, monitoring method, and program

Determining an order for launching tasks by data processing device, task control method, and computer readable medium

Information processing device and information processing method

Data server unit and communication system including master-slave management circuitry

Data collecting apparatus, data collecting method, and program

Data distribution system, data processing device, and program

HITACHI LTD

Apparatus for suppressing electrification of sample in charged beam irradiation apparatus

Apparatus and method for ion beam neutralization

Apparatus and method for suppressing electrification of sample in charged beam irradiation apparatus

Method for measuring dimensions of sample and scanning electron microscope

HITACHI HIGH TECH CORP

Image processing apparatus for analysis of pattern matching failure

Charged particle beam system

Method for detecting information of an electric potential on a sample and charged particle beam apparatus

Method and apparatus for measuring displacement between patterns and scanning electron microscope installing unit for measuring displacement between patterns

YAMAZAKI MINORU

Method for detecting information of an electric potential on a sample and charged particle beam apparatus

Method for detecting information of an electronic potential on a sample and charged particle beam apparatus

KOMURO OSAMU

Charged particle beam system

IKEDA MITSUJI

Image processing apparatus for analysis of pattern matching failure

KUBO TOSHIAKI

Image processing device and method, and image display device and method

SUKENO JUNJI

Multi-screen display system

KONO AKEMI

Method for adjusting optical axis of charged particle radiation and charged particle radiation device

NASU OSAMU

Sample dimension measuring method and scanning electron microscope