Inventor
TSUNEMORI TAKEHIRO
JP4 patents
⚠️ This page may combine multiple inventors who share the name “TSUNEMORI TAKEHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SUMCO CORP
3 patentsUS12560554B2Feb 24, 2026
Silicon wafer defect inspection method and silicon wafer defect inspection system
SUMCO CORP0 citations58
US12107018B2Oct 1, 2024
Method of measuring concentration of Fe in p-type silicon wafer and SPV measurement apparatus
SUMCO CORP0 citations58
US11387151B2Jul 12, 2022
Method of measuring concentration of Fe in p-type silicon wafer and SPV measurement apparatus
SUMCO CORP0 citations58