Inventor

OH GHILGEUN

KR2 patents

Patents

2 patents

US12265778B2Apr 1, 2025

Method of detecting defective layer of semiconductor device and computing system for performing the same

SAMSUNG ELECTRONICS CO LTD0 citations48

US12379328B2Aug 5, 2025

Inspection system and inspection method for semiconductor device

SAMSUNG ELECTRONICS CO LTD0 citations41