Inventor
JEON SEUNGWAN
KR3 patents
Patents
3 patentsUS12013628B2Jun 18, 2024
Methods for evaluating performance of image sensors and/or selecting settings of image sensors
SAMSUNG ELECTRONICS CO LTD2 citations63
US12573195B2Mar 10, 2026
Method for evaluating performance of image signal processor
SAMSUNG ELECTRONICS CO LTD0 citations53
US12236567B2Feb 25, 2025
Image evaluation method that can quantify images distorted by artifacts, computer program performing the method, and computing device
SAMSUNG ELECTRONICS CO LTD0 citations53