Inventor
KU CHI-FA
TW32 patents
Patents
32 patentsUS9564217B1Feb 7, 2017
Semiconductor memory device having integrated DOSRAM and NOSRAM
UNITED MICROELECTRONICS CORP18 citations92
US9064719B1Jun 23, 2015
Integrated circuit and method of forming integrated circuit
UNITED MICROELECTRONICS CORP22 citations92
US6025206AFeb 15, 2000
Method for detecting defects
UNITED MICROELECTRONICS CORP46 citations89
US9431441B1Aug 30, 2016
Image sensor pixel structure
UNITED MICROELECTRONICS CORP15 citations84
US9412734B2Aug 9, 2016
Structure with inductor and MIM capacitor
UNITED MICROELECTRONICS CORP7 citations84
US9455351B1Sep 27, 2016
Oxide semiconductor field effect transistor device and method for manufacturing the same
UNITED MICROELECTRONICS CORP3 citations73
US9893066B2Feb 13, 2018
Semiconductor transistor device and method for fabricating the same
UNITED MICROELECTRONICS CORP2 citations71
US9627549B1Apr 18, 2017
Semiconductor transistor device and method for fabricating the same
UNITED MICROELECTRONICS CORP3 citations71
US9607123B2Mar 28, 2017
Method for performing deep n-typed well-correlated (DNW-correlated) antenna rule check of integrated circuit and semiconductor structure complying with DNW-correlated antenna rule
UNITED MICROELECTRONICS CORP2 citations71
US6153360ANov 28, 2000
Method of removing photo-resist
UNITED MICROELECTRONICS CORP5 citations70
US5773082AJun 30, 1998
Method for applying photoresist on wafer
UNITED MICROELECTRONICS CORP10 citations70
US11011649B2May 18, 2021
Oxide semiconductor device and method of manufacturing the same
UNITED MICROELECTRONICS CORP0 citations62
US9627547B2Apr 18, 2017
Semiconductor structure
UNITED MICROELECTRONICS CORP1 citations62
US6136665AOct 24, 2000
Method for forming a recess-free buffer layer
UNITED MICROELECTRONICS CORP3 citations61
US6304387B1Oct 16, 2001
Method of predicting the curvature radius of the microlens
UNITED MICROELECTRONICS CORP3 citations60
US6283134B1Sep 4, 2001
Apparatus for removing photo-resist
UNITED MICROELECTRONICS CORP3 citations59
US10644166B2May 5, 2020
Method for forming semiconductor structure
UNITED MICROELECTRONICS CORP0 citations52
US10115786B2Oct 30, 2018
Capacitor and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations52
US10102907B2Oct 16, 2018
Method for fabricating semiconductor memory device having integrated DOSRAM and NOSRAM
UNITED MICROELECTRONICS CORP0 citations52
US10103273B2Oct 16, 2018
Semiconductor structure
UNITED MICROELECTRONICS CORP0 citations52
US10043917B2Aug 7, 2018
Oxide semiconductor device and method of manufacturing the same
UNITED MICROELECTRONICS CORP0 citations52
US9966428B2May 8, 2018
Capacitor and fabrication method thereof
UNITED MICROELECTRONICS CORP1 citations52
US9851780B2Dec 26, 2017
Semiconductor device and operating method thereof
UNITED MICROELECTRONICS CORP0 citations52
US9530834B1Dec 27, 2016
Capacitor and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations52
US9349873B1May 24, 2016
Oxide semiconductor device and method of fabricating the same
UNITED MICROELECTRONICS CORP0 citations52
US6422246B1Jul 23, 2002
Method removing residual photoresist
UNITED MICROELECTRONICS CORP1 citations52
US9620649B1Apr 11, 2017
Semiconductor device and manufacturing method thereof
UNITED MICROELECTRONICS CORP1 citations51
US9577029B2Feb 21, 2017
Metal-insulator-metal capacitor structure and method for manufacturing the same
UNITED MICROELECTRONICS CORP0 citations51
US9305994B2Apr 5, 2016
Semiconductor apparatus with multi-layer capacitance structure
UNITED MICROELECTRONICS CORP1 citations51
US6007953ADec 28, 1999
Method of avoiding peeling on wafer edge and mark number
UNITED MICROELECTRONICS CORP0 citations51
US10056493B2Aug 21, 2018
Semiconductor device
UNITED MICROELECTRONICS CORP0 citations50
US9887293B2Feb 6, 2018
Semiconductor device
UNITED MICROELECTRONICS CORP0 citations50