Inventor
KWAN MING SANG
US30 patents
⚠️ This page may combine multiple inventors who share the name “KWAN MING SANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SPANSION LLC
8 patentsUS7319615B1Jan 15, 2008
Ramp gate erase for dual bit flash memory
SPANSION LLC17 citations82
US7713875B2May 11, 2010
Variable salicide block for resistance equalization in an array
SPANSION LLC6 citations63
US7626869B2Dec 1, 2009
Multi-phase wordline erasing for flash memory
SPANSION LLC3 citations62
US7561471B2Jul 14, 2009
Cycling improvement using higher erase bias
SPANSION LLC6 citations62
US7553727B2Jun 30, 2009
Using implanted poly-1 to improve charging protection in dual-poly process
SPANSION LLC2 citations62
US7977218B2Jul 12, 2011
Thin oxide dummy tiling as charge protection
SPANSION LLC3 citations60
US7888218B2Feb 15, 2011
Using thick spacer for bitline implant then remove
SPANSION LLC0 citations42
US7671405B2Mar 2, 2010
Deep bitline implant to avoid program disturb
SPANSION LLC0 citations42
ADVANCED MICRO DEVICES INC
6 patentsUS5521867AMay 28, 1996
Adjustable threshold voltage conversion circuit
ADVANCED MICRO DEVICES INC25 citations92
US6894925B1May 17, 2005
Flash memory cell programming method and system
ADVANCED MICRO DEVICES INC17 citations84
US6747900B1Jun 8, 2004
Memory circuit arrangement for programming a memory cell
ADVANCED MICRO DEVICES INC16 citations83
US5652155AJul 29, 1997
Method for making semiconductor circuit including non-ESD transistors with reduced degradation due to an impurity implant
ADVANCED MICRO DEVICES INC8 citations74
US5882985AMar 16, 1999
Reduction of field oxide step height during semiconductor fabrication
ADVANCED MICRO DEVICES INC3 citations63
US5981994ANov 9, 1999
Method and semiconductor circuit for maintaining integrity of field threshold voltage requirements
ADVANCED MICRO DEVICES INC0 citations52
CYPRESS SEMICONDUCTOR CORP
5 patentsUS10361215B2Jul 23, 2019
NAND memory cell string having a stacked select gate structure and process for for forming same
CYPRESS SEMICONDUCTOR CORP4 citations84
US10038004B2Jul 31, 2018
NAND memory cell string having a stacked select gate structure and process for for forming same
CYPRESS SEMICONDUCTOR CORP5 citations84
US10566341B2Feb 18, 2020
NAND memory cell string having a stacked select gate structure and process for for forming same
CYPRESS SEMICONDUCTOR CORP3 citations73
US11069699B2Jul 20, 2021
NAND memory cell string having a stacked select gate structure and process for forming same
CYPRESS SEMICONDUCTOR CORP0 citations62
US10756101B2Aug 25, 2020
NAND memory cell string having a stacked select gate structure and process for for forming same
CYPRESS SEMICONDUCTOR CORP0 citations52
HYUNDAI ELECTRONICS AMERICA
4 patentsUS6347054B1Feb 12, 2002
Method of operating flash memory
HYUNDAI ELECTRONICS AMERICA17 citations92
US6043123AMar 28, 2000
Triple well flash memory fabrication process
HYUNDAI ELECTRONICS AMERICA38 citations92
US6366499B1Apr 2, 2002
Method of operating flash memory
HYUNDAI ELECTRONICS AMERICA28 citations89
US7154141B2Dec 26, 2006
Source side programming
HYUNDAI ELECTRONICS AMERICA16 citations82