Inventor
PICKERD JOHN J
US67 patents
⚠️ This page may combine multiple inventors who share the name “PICKERD JOHN J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TEKTRONIX INC
46 patentsUS5978742ANov 2, 1999
Method and apparatus for digital sampling of electrical waveforms
TEKTRONIX INC113 citations98
US6615148B2Sep 2, 2003
Streaming distributed test and measurement instrument
TEKTRONIX INC57 citations96
US7414411B2Aug 19, 2008
Signal analysis system and calibration method for multiple signal probes
TEKTRONIX INC22 citations93
US7408363B2Aug 5, 2008
Signal analysis system and calibration method for processing acquires signal samples with an arbitrary load
TEKTRONIX INC22 citations93
US6807496B2Oct 19, 2004
Acquisition system for a long record length digital storage oscilloscope
TEKTRONIX INC32 citations93
US6748335B2Jun 8, 2004
Acquisition system for a multi-channel relatively long record length digital storage oscilloscope
TEKTRONIX INC30 citations93
US7474972B2Jan 6, 2009
Bandwidth multiplication for a test and measurement instrument using non-periodic functions for mixing
TEKTRONIX INC24 citations92
US6892150B2May 10, 2005
Combined analog and DSP trigger system for a digital storage oscilloscope
TEKTRONIX INC43 citations92
US6681191B1Jan 20, 2004
Frequency domain analysis system for a time domain measurement instrument
TEKTRONIX INC35 citations92
US7271575B2Sep 18, 2007
Oscilloscope based return loss analyzer
TEKTRONIX INC31 citations90
US7460983B2Dec 2, 2008
Signal analysis system and calibration method
TEKTRONIX INC30 citations89
US8588703B2Nov 19, 2013
Arbitrary multiband overlay mixer apparatus and method for bandwidth multiplication
TEKTRONIX INC7 citations84
US7206722B2Apr 17, 2007
Oscilloscope having an enhancement filter
TEKTRONIX INC11 citations84
US6525522B1Feb 25, 2003
System for determining the phase and magnitude of an incident signal relative to a cyclical reference signal
TEKTRONIX INC18 citations84
US6459256B1Oct 1, 2002
Digital storage oscilloscope
TEKTRONIX INC16 citations84
US7405575B2Jul 29, 2008
Signal analysis system and calibration method for measuring the impedance of a device under test
TEKTRONIX INC18 citations83
US7298206B2Nov 20, 2007
Multi-band amplifier for test and measurement instruments
TEKTRONIX INC15 citations77
US12442852B2Oct 14, 2025
Tuning a device under test using parallel pipeline machine learning assistance
TEKTRONIX INC2 citations75
US12146914B2Nov 19, 2024
Bit error ratio estimation using machine learning
TEKTRONIX INC4 citations74
US7257497B2Aug 14, 2007
Sequential frequency band acquisition apparatus for test and measurement instruments
TEKTRONIX INC9 citations74
US6915218B2Jul 5, 2005
Method of constraints control for oscilloscope timebase subsection and display parameters
TEKTRONIX INC11 citations74
US11146280B2Oct 12, 2021
Digital signal processing waveform synthesis for fixed sample rate signal sources
TEKTRONIX INC2 citations73
US10432434B2Oct 1, 2019
Multi-band noise reduction systems and methods
TEKTRONIX INC2 citations73
US10345339B2Jul 9, 2019
Group delay based averaging
TEKTRONIX INC2 citations73
US9772391B2Sep 26, 2017
Method for probe equalization
TEKTRONIX INC4 citations73
US9432042B2Aug 30, 2016
Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing
TEKTRONIX INC4 citations73
US6917889B2Jul 12, 2005
Method and apparatus for visually time-correlating waveform measurements to a source waveform
TEKTRONIX INC10 citations73
US10097222B2Oct 9, 2018
Variable passive network noise filter for noise reduction
TEKTRONIX INC3 citations72
US12328242B2Jun 10, 2025
Eye classes separator with overlay, and composite, and dynamic eye-trigger for humans and machine learning
TEKTRONIX INC0 citations63
US12092692B2Sep 17, 2024
Cyclic loop image representation for waveform data
TEKTRONIX INC0 citations63
US11940889B2Mar 26, 2024
Combined TDECQ measurement and transmitter tuning using machine learning
TEKTRONIX INC0 citations63
US11907090B2Feb 20, 2024
Machine learning for taps to accelerate TDECQ and other measurements
TEKTRONIX INC0 citations63
US11598805B2Mar 7, 2023
Low frequency S-parameter measurement
TEKTRONIX INC0 citations63
US11422584B2Aug 23, 2022
Jitter insertion system for waveform generation
TEKTRONIX INC0 citations63
US9407280B1Aug 2, 2016
Harmonic time domain interleave to extend arbitrary waveform generator bandwidth and sample rate
TEKTRONIX INC2 citations63
US8928514B1Jan 6, 2015
Harmonic time domain interleave to extend oscilloscope bandwidth and sample rate
TEKTRONIX INC3 citations63
US7155355B2Dec 26, 2006
Method of constraints control for oscilloscope vertical subsection and display parameters
TEKTRONIX INC3 citations63
US7098839B2Aug 29, 2006
Flash array digitizer
TEKTRONIX INC2 citations63
US10904042B2Jan 26, 2021
Passive variable continuous time linear equalizer with attenuation and frequency control
TEKTRONIX INC0 citations62
US10330700B2Jun 25, 2019
Signal acquisition probe storing compressed or compressed and filtered time domain impulse or step response data for use in a signal measurement system
TEKTRONIX INC1 citations62
US7254498B2Aug 7, 2007
Method and apparatus for providing bandwidth extension and channel match for oscilloscopes
TEKTRONIX INC2 citations59
US11923895B2Mar 5, 2024
Optical transmitter tuning using machine learning and reference parameters
TEKTRONIX INC1 citations58
US10502763B2Dec 10, 2019
Noise reduction in digitizing systems
TEKTRONIX INC1 citations58
US12379414B2Aug 5, 2025
System and method for multi-level signal cyclic loop image representations for measurements and machine learning
TEKTRONIX INC0 citations56
US12085590B2Sep 10, 2024
Swept parameter oscilloscope
TEKTRONIX INC0 citations54
US11923896B2Mar 5, 2024
Optical transceiver tuning using machine learning
TEKTRONIX INC1 citations54
M PARTHASARATHY RAJU
1 patentBOOMAN RICHARD A
1 patentTAN KAN
1 patentSONIX INC
1 patentShowing the top 50 of 67 patents by PatentIndex Score.