P

Inventor

PICKERD JOHN J

US67 patents
⚠️ This page may combine multiple inventors who share the name “PICKERD JOHN J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TEKTRONIX INC

46 patents
US5978742ANov 2, 1999

Method and apparatus for digital sampling of electrical waveforms

TEKTRONIX INC113 citations98
US6615148B2Sep 2, 2003

Streaming distributed test and measurement instrument

TEKTRONIX INC57 citations96
US7414411B2Aug 19, 2008

Signal analysis system and calibration method for multiple signal probes

TEKTRONIX INC22 citations93
US7408363B2Aug 5, 2008

Signal analysis system and calibration method for processing acquires signal samples with an arbitrary load

TEKTRONIX INC22 citations93
US6807496B2Oct 19, 2004

Acquisition system for a long record length digital storage oscilloscope

TEKTRONIX INC32 citations93
US6748335B2Jun 8, 2004

Acquisition system for a multi-channel relatively long record length digital storage oscilloscope

TEKTRONIX INC30 citations93
US7474972B2Jan 6, 2009

Bandwidth multiplication for a test and measurement instrument using non-periodic functions for mixing

TEKTRONIX INC24 citations92
US6892150B2May 10, 2005

Combined analog and DSP trigger system for a digital storage oscilloscope

TEKTRONIX INC43 citations92
US6681191B1Jan 20, 2004

Frequency domain analysis system for a time domain measurement instrument

TEKTRONIX INC35 citations92
US7271575B2Sep 18, 2007

Oscilloscope based return loss analyzer

TEKTRONIX INC31 citations90
US7460983B2Dec 2, 2008

Signal analysis system and calibration method

TEKTRONIX INC30 citations89
US8588703B2Nov 19, 2013

Arbitrary multiband overlay mixer apparatus and method for bandwidth multiplication

TEKTRONIX INC7 citations84
US7206722B2Apr 17, 2007

Oscilloscope having an enhancement filter

TEKTRONIX INC11 citations84
US6525522B1Feb 25, 2003

System for determining the phase and magnitude of an incident signal relative to a cyclical reference signal

TEKTRONIX INC18 citations84
US6459256B1Oct 1, 2002

Digital storage oscilloscope

TEKTRONIX INC16 citations84
US7405575B2Jul 29, 2008

Signal analysis system and calibration method for measuring the impedance of a device under test

TEKTRONIX INC18 citations83
US7298206B2Nov 20, 2007

Multi-band amplifier for test and measurement instruments

TEKTRONIX INC15 citations77
US12442852B2Oct 14, 2025

Tuning a device under test using parallel pipeline machine learning assistance

TEKTRONIX INC2 citations75
US12146914B2Nov 19, 2024

Bit error ratio estimation using machine learning

TEKTRONIX INC4 citations74
US7257497B2Aug 14, 2007

Sequential frequency band acquisition apparatus for test and measurement instruments

TEKTRONIX INC9 citations74
US6915218B2Jul 5, 2005

Method of constraints control for oscilloscope timebase subsection and display parameters

TEKTRONIX INC11 citations74
US11146280B2Oct 12, 2021

Digital signal processing waveform synthesis for fixed sample rate signal sources

TEKTRONIX INC2 citations73
US10432434B2Oct 1, 2019

Multi-band noise reduction systems and methods

TEKTRONIX INC2 citations73
US10345339B2Jul 9, 2019

Group delay based averaging

TEKTRONIX INC2 citations73
US9772391B2Sep 26, 2017

Method for probe equalization

TEKTRONIX INC4 citations73
US9432042B2Aug 30, 2016

Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing

TEKTRONIX INC4 citations73
US6917889B2Jul 12, 2005

Method and apparatus for visually time-correlating waveform measurements to a source waveform

TEKTRONIX INC10 citations73
US10097222B2Oct 9, 2018

Variable passive network noise filter for noise reduction

TEKTRONIX INC3 citations72
US12328242B2Jun 10, 2025

Eye classes separator with overlay, and composite, and dynamic eye-trigger for humans and machine learning

TEKTRONIX INC0 citations63
US12092692B2Sep 17, 2024

Cyclic loop image representation for waveform data

TEKTRONIX INC0 citations63
US11940889B2Mar 26, 2024

Combined TDECQ measurement and transmitter tuning using machine learning

TEKTRONIX INC0 citations63
US11907090B2Feb 20, 2024

Machine learning for taps to accelerate TDECQ and other measurements

TEKTRONIX INC0 citations63
US11598805B2Mar 7, 2023

Low frequency S-parameter measurement

TEKTRONIX INC0 citations63
US11422584B2Aug 23, 2022

Jitter insertion system for waveform generation

TEKTRONIX INC0 citations63
US9407280B1Aug 2, 2016

Harmonic time domain interleave to extend arbitrary waveform generator bandwidth and sample rate

TEKTRONIX INC2 citations63
US8928514B1Jan 6, 2015

Harmonic time domain interleave to extend oscilloscope bandwidth and sample rate

TEKTRONIX INC3 citations63
US7155355B2Dec 26, 2006

Method of constraints control for oscilloscope vertical subsection and display parameters

TEKTRONIX INC3 citations63
US7098839B2Aug 29, 2006

Flash array digitizer

TEKTRONIX INC2 citations63
US10904042B2Jan 26, 2021

Passive variable continuous time linear equalizer with attenuation and frequency control

TEKTRONIX INC0 citations62
US10330700B2Jun 25, 2019

Signal acquisition probe storing compressed or compressed and filtered time domain impulse or step response data for use in a signal measurement system

TEKTRONIX INC1 citations62
US7254498B2Aug 7, 2007

Method and apparatus for providing bandwidth extension and channel match for oscilloscopes

TEKTRONIX INC2 citations59
US11923895B2Mar 5, 2024

Optical transmitter tuning using machine learning and reference parameters

TEKTRONIX INC1 citations58
US10502763B2Dec 10, 2019

Noise reduction in digitizing systems

TEKTRONIX INC1 citations58
US12379414B2Aug 5, 2025

System and method for multi-level signal cyclic loop image representations for measurements and machine learning

TEKTRONIX INC0 citations56
US12085590B2Sep 10, 2024

Swept parameter oscilloscope

TEKTRONIX INC0 citations54
US11923896B2Mar 5, 2024

Optical transceiver tuning using machine learning

TEKTRONIX INC1 citations54

M PARTHASARATHY RAJU

1 patent

BOOMAN RICHARD A

1 patent

TAN KAN

1 patent

SONIX INC

1 patent

Showing the top 50 of 67 patents by PatentIndex Score.