Inventor
NAKANO TOMOHITO
JP29 patents
⚠️ This page may combine multiple inventors who share the name “NAKANO TOMOHITO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SEIKO EPSON CORP
15 patentsUS9605172B2Mar 28, 2017
Ink composition, set of ink composition and ink container, ink container, and recording apparatus
SEIKO EPSON CORP6 citations83
US9371458B2Jun 21, 2016
Ink composition for ink jet recording and ink jet recording method
SEIKO EPSON CORP7 citations83
US9567473B2Feb 14, 2017
Ink container
SEIKO EPSON CORP2 citations72
US9109132B2Aug 18, 2015
Ink container
SEIKO EPSON CORP2 citations62
US12319825B2Jun 3, 2025
Ink jet ink composition and ink set
SEIKO EPSON CORP0 citations60
US11014368B2May 25, 2021
Ink jet recording apparatus and ink jet recording set
SEIKO EPSON CORP0 citations56
US10647865B2May 12, 2020
Ink composition
SEIKO EPSON CORP0 citations52
US10407584B2Sep 10, 2019
Water-based ink composition and method of discharging liquid droplet
SEIKO EPSON CORP0 citations52
US9783691B2Oct 10, 2017
Ink set and recording method
SEIKO EPSON CORP0 citations52
US12325801B2Jun 10, 2025
Ink jet ink set, ink jet recording method, and ink jet recording apparatus
SEIKO EPSON CORP0 citations51
US12091564B2Sep 17, 2024
Ink accommodating body and ink composition
SEIKO EPSON CORP0 citations51
US10479103B2Nov 19, 2019
Aqueous ink composition and ink jet recording apparatus
SEIKO EPSON CORP0 citations51
US10301493B2May 28, 2019
Aqueous ink jet ink composition
SEIKO EPSON CORP0 citations51
US9592680B2Mar 14, 2017
Ink jet recording method, photocurable ink jet ink composition, and ink jet recording device
SEIKO EPSON CORP0 citations51
US9186911B2Nov 17, 2015
Ink jet recording method, photocurable ink jet ink composition, and ink jet recording device
SEIKO EPSON CORP0 citations51
SHIMADZU CORP
8 patentsUS11721536B2Aug 8, 2023
Mass spectrometer
SHIMADZU CORP5 citations74
US8927929B1Jan 6, 2015
Mass spectrometer
SHIMADZU CORP3 citations62
US8354636B2Jan 15, 2013
Mass spectrometer
SHIMADZU CORP2 citations62
US10354853B2Jul 16, 2019
ICP mass spectrometer
SHIMADZU CORP0 citations41
US10354854B2Jul 16, 2019
Shutter
SHIMADZU CORP0 citations41
US9254497B2Feb 9, 2016
Ionization probe
SHIMADZU CORP0 citations41
US9008496B2Apr 14, 2015
Probe
SHIMADZU CORP0 citations41
US9633826B1Apr 25, 2017
Mass spectrometer with movable ionization chamber
SHIMADZU CORP0 citations37
HITACHI HIGH TECH CORP
3 patentsUS10566172B2Feb 18, 2020
Charged particle beam apparatus and method for adjusting imaging conditions for the same
HITACHI HIGH TECH CORP1 citations61
US12424406B2Sep 23, 2025
Charged particle beam device, and method for adjusting image capturing conditions in said charged particle beam device
HITACHI HIGH TECH CORP0 citations51
US10770266B2Sep 8, 2020
Charged particle beam device and capturing condition adjusting method in charged particle beam device
HITACHI HIGH TECH CORP0 citations51
NAKANO TOMOHITO
3 patentsUS9146217B2Sep 29, 2015
Rack with movable shielding component, and auto-sampler having the rack
NAKANO TOMOHITO2 citations59
US8173958B2May 8, 2012
Mass spectrometer
NAKANO TOMOHITO0 citations48
US9214327B2Dec 15, 2015
Vacuum analyzer utilizing resistance tubes to control the flow rate through a vacuum reaction chamber
NAKANO TOMOHITO0 citations38