Inventor
BAEG SANG HYEON
US10 patents
⚠️ This page may combine multiple inventors who share the name “BAEG SANG HYEON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CISCO TECH INC
5 patentsUS7269770B1Sep 11, 2007
AC coupled line testing using boundary scan test methodology
CISCO TECH INC14 citations83
US7174492B1Feb 6, 2007
AC coupled line testing using boundary scan test methodology
CISCO TECH INC14 citations83
US7487412B2Feb 3, 2009
Test buffer design and interface mechanism for differential receiver AC/DC boundary scan test
CISCO TECH INC6 citations73
US7089463B1Aug 8, 2006
Test buffer design and interface mechanism for differential receiver AC/DC boundary scan test
CISCO TECH INC6 citations73
US7089470B1Aug 8, 2006
Programmable test pattern and capture mechanism for boundary scan
CISCO TECH INC7 citations71
SAMSUNG ELECTRONICS CO LTD
3 patentsUS6019502AFeb 1, 2000
Test circuits and methods for built-in testing integrated devices
SAMSUNG ELECTRONICS CO LTD15 citations72
US5754758AMay 19, 1998
Serial memory interface using interlaced scan
SAMSUNG ELECTRONICS CO LTD13 citations69
US5706293AJan 6, 1998
Method of testing single-order address memory
SAMSUNG ELECTRONICS CO LTD6 citations61