Inventor

AN JANG-HYUK

KR4 patents

⚠️ This page may combine multiple inventors who share the name “AN JANG-HYUK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

2 patents

US10067813B2Sep 4, 2018

Method of analyzing a fault of an electronic system

SAMSUNG ELECTRONICS CO LTD3 citations70

US10789112B2Sep 29, 2020

Device lifespan estimation method, device design method, and computer readable storage medium

SAMSUNG ELECTRONICS CO LTD1 citations57

KIM SUNG-SOO

1 patent

US8266572B2Sep 11, 2012

Method for acquiring overshoot voltage and analyzing degradation of a gate insulation using the same

KIM SUNG-SOO7 citations79

CHO YONG-SANG

1 patent

US8680883B2Mar 25, 2014

Time dependent dielectric breakdown (TDDB) test structure of semiconductor device and method of performing TDDB test using the same

CHO YONG-SANG4 citations65