Inventor
NAKAMURA TOMONORI
JP115 patents
⚠️ This page may combine multiple inventors who share the name “NAKAMURA TOMONORI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HAMAMATSU PHOTONICS KK
17 patentsUS12072289B2Aug 27, 2024
Inspection apparatus comprising a first imager imaging fluorescence having a wavelength longer than a first wavelength and a second imager imaging fluorescence having a wavelength shorter than a second wavelength and inspection method
HAMAMATSU PHOTONICS KK2 citations73
US10330615B2Jun 25, 2019
Analysis system and analysis method
HAMAMATSU PHOTONICS KK4 citations73
US9588175B2Mar 7, 2017
Semiconductor device inspection device and semiconductor device inspection method
HAMAMATSU PHOTONICS KK4 citations73
US9618576B2Apr 11, 2017
Apparatus for testing a semiconductor device and method of testing a semiconductor device
HAMAMATSU PHOTONICS KK3 citations72
US9618550B2Apr 11, 2017
Apparatus for frequency analyzing a measurement target and method of frequency analyzing a measurement target
HAMAMATSU PHOTONICS KK3 citations72
US9618563B2Apr 11, 2017
Semiconductor device inspection device and semiconductor device inspection method
HAMAMATSU PHOTONICS KK2 citations72
US9562944B2Feb 7, 2017
Semiconductor device inspection device and semiconductor device inspection method
HAMAMATSU PHOTONICS KK3 citations72
US11694324B2Jul 4, 2023
Inspection apparatus and inspection method
HAMAMATSU PHOTONICS KK2 citations71
US12467740B2Nov 11, 2025
Imaging unit and measurement device
HAMAMATSU PHOTONICS KK0 citations63
US12228515B2Feb 18, 2025
Inspection apparatus and inspection method
HAMAMATSU PHOTONICS KK0 citations63
US11415525B2Aug 16, 2022
Carrier lifespan measurement method and carrier lifespan measurement device
HAMAMATSU PHOTONICS KK0 citations63
US11280776B2Mar 22, 2022
Concentration measurement method and concentration measurement device
HAMAMATSU PHOTONICS KK0 citations63
US11256079B2Feb 22, 2022
Solid immersion lens unit and semiconductor detector device
HAMAMATSU PHOTONICS KK0 citations63
US10976284B2Apr 13, 2021
Inspection device and inspection method
HAMAMATSU PHOTONICS KK0 citations63
US11841393B2Dec 12, 2023
Cooling unit, objective lens module, semiconductor inspection device, and semiconductor inspection method
HAMAMATSU PHOTONICS KK0 citations62
US11009531B2May 18, 2021
Image generating method, image generating device, image generating program, and storage medium
HAMAMATSU PHOTONICS KK0 citations62
US10698006B2Jun 30, 2020
Inspection method and inspection apparatus
HAMAMATSU PHOTONICS KK1 citations62
SHINKAWA KK
7 patentsUS11024596B2Jun 1, 2021
Bonding apparatus and bonding method
SHINKAWA KK7 citations83
US11296048B2Apr 5, 2022
Semiconductor chip mounting device and method for manufacturing semiconductor device
SHINKAWA KK2 citations73
US11094567B2Aug 17, 2021
Mounting apparatus and method for manufacturing semiconductor device
SHINKAWA KK4 citations73
US11189594B2Nov 30, 2021
Bonding apparatus and bonding method
SHINKAWA KK2 citations72
US11512411B2Nov 29, 2022
PTFE sheet and method for mounting die
SHINKAWA KK2 citations71
US10978420B2Apr 13, 2021
Semiconductor chip mounting apparatus and semiconductor chip mounting method
SHINKAWA KK4 citations71
US11387211B2Jul 12, 2022
Bonding apparatus and bonding method
SHINKAWA KK0 citations62
SEIKO EPSON CORP
5 patentsUS7458663B2Dec 2, 2008
Pressure-regulating valve, functional liquid supplying apparatus, imaging apparatus, method of manufacturing electro-optic device, electro-optic device, and electronic apparatus
SEIKO EPSON CORP9 citations84
US9114649B2Aug 25, 2015
Inkjet recording apparatus
SEIKO EPSON CORP4 citations73
US9156289B2Oct 13, 2015
Recording device
SEIKO EPSON CORP2 citations63
US8827409B2Sep 9, 2014
Recording apparatus
SEIKO EPSON CORP2 citations63
US7880873B2Feb 1, 2011
Droplet discharge device
SEIKO EPSON CORP2 citations62
NAKAMURA TOMONORI
4 patentsUS9099350B2Aug 4, 2015
Apparatus for inspecting integrated circuit
NAKAMURA TOMONORI7 citations84
US8503869B2Aug 6, 2013
Stereoscopic video playback device and stereoscopic video display device
NAKAMURA TOMONORI8 citations83
US8937310B2Jan 20, 2015
Detection method for semiconductor integrated circuit device, and semiconductor integrated circuit device
NAKAMURA TOMONORI3 citations62
US8178940B2May 15, 2012
Schottky barrier diode and method for using the same
NAKAMURA TOMONORI3 citations62
PANASONIC IP CORP AMERICA
4 patentsUS8949884B2Feb 3, 2015
Broadcast receiving apparatus, broadcast receiving method, and program
PANASONIC IP CORP AMERICA10 citations83
US9825773B2Nov 21, 2017
Device control by speech commands with microphone and camera to acquire line-of-sight information
PANASONIC IP CORP AMERICA3 citations73
US9538375B2Jan 3, 2017
Method for configuring wireless connection settings, wireless communications apparatus, and display method
PANASONIC IP CORP AMERICA2 citations71
US10185534B2Jan 22, 2019
Control method, controller, and recording medium
PANASONIC IP CORP AMERICA3 citations70
KANSAI ELECTRIC POWER CO
3 patentsUS7960738B2Jun 14, 2011
Silicon carbide semiconductor device and manufacturing method therefor
KANSAI ELECTRIC POWER CO1 citations62
US7960737B2Jun 14, 2011
Silicon carbide semiconductor device and manufacturing method therefor
KANSAI ELECTRIC POWER CO2 citations62
US7960257B2Jun 14, 2011
Silicon carbide semiconductor device and manufacturing method therefor
KANSAI ELECTRIC POWER CO1 citations62
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD
2 patentsHONDA MOTOR CO LTD
2 patentsCENTRAL RES INST ELECT
2 patentsISHII RYOSUKE
1 patentKANSAI ELECTRIC CO INC
1 patentCANON KK
1 patentNISHIKAWA RUBBER CO LTD
1 patentShowing the top 50 of 115 patents by PatentIndex Score.