P

Inventor

NAKAMURA TOMONORI

JP115 patents
⚠️ This page may combine multiple inventors who share the name “NAKAMURA TOMONORI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HAMAMATSU PHOTONICS KK

17 patents
US12072289B2Aug 27, 2024

Inspection apparatus comprising a first imager imaging fluorescence having a wavelength longer than a first wavelength and a second imager imaging fluorescence having a wavelength shorter than a second wavelength and inspection method

HAMAMATSU PHOTONICS KK2 citations73
US10330615B2Jun 25, 2019

Analysis system and analysis method

HAMAMATSU PHOTONICS KK4 citations73
US9588175B2Mar 7, 2017

Semiconductor device inspection device and semiconductor device inspection method

HAMAMATSU PHOTONICS KK4 citations73
US9618576B2Apr 11, 2017

Apparatus for testing a semiconductor device and method of testing a semiconductor device

HAMAMATSU PHOTONICS KK3 citations72
US9618550B2Apr 11, 2017

Apparatus for frequency analyzing a measurement target and method of frequency analyzing a measurement target

HAMAMATSU PHOTONICS KK3 citations72
US9618563B2Apr 11, 2017

Semiconductor device inspection device and semiconductor device inspection method

HAMAMATSU PHOTONICS KK2 citations72
US9562944B2Feb 7, 2017

Semiconductor device inspection device and semiconductor device inspection method

HAMAMATSU PHOTONICS KK3 citations72
US11694324B2Jul 4, 2023

Inspection apparatus and inspection method

HAMAMATSU PHOTONICS KK2 citations71
US12467740B2Nov 11, 2025

Imaging unit and measurement device

HAMAMATSU PHOTONICS KK0 citations63
US12228515B2Feb 18, 2025

Inspection apparatus and inspection method

HAMAMATSU PHOTONICS KK0 citations63
US11415525B2Aug 16, 2022

Carrier lifespan measurement method and carrier lifespan measurement device

HAMAMATSU PHOTONICS KK0 citations63
US11280776B2Mar 22, 2022

Concentration measurement method and concentration measurement device

HAMAMATSU PHOTONICS KK0 citations63
US11256079B2Feb 22, 2022

Solid immersion lens unit and semiconductor detector device

HAMAMATSU PHOTONICS KK0 citations63
US10976284B2Apr 13, 2021

Inspection device and inspection method

HAMAMATSU PHOTONICS KK0 citations63
US11841393B2Dec 12, 2023

Cooling unit, objective lens module, semiconductor inspection device, and semiconductor inspection method

HAMAMATSU PHOTONICS KK0 citations62
US11009531B2May 18, 2021

Image generating method, image generating device, image generating program, and storage medium

HAMAMATSU PHOTONICS KK0 citations62
US10698006B2Jun 30, 2020

Inspection method and inspection apparatus

HAMAMATSU PHOTONICS KK1 citations62

SHINKAWA KK

7 patents

SEIKO EPSON CORP

5 patents

NAKAMURA TOMONORI

4 patents

PANASONIC IP CORP AMERICA

4 patents

KANSAI ELECTRIC POWER CO

3 patents

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD

2 patents

HONDA MOTOR CO LTD

2 patents

CENTRAL RES INST ELECT

2 patents

ISHII RYOSUKE

1 patent

KANSAI ELECTRIC CO INC

1 patent

CANON KK

1 patent

NISHIKAWA RUBBER CO LTD

1 patent

Showing the top 50 of 115 patents by PatentIndex Score.