P

Inventor

SAITO MASARU

JP54 patents
⚠️ This page may combine multiple inventors who share the name “SAITO MASARU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FUJI ELECTRIC CO LTD

16 patents
US6525390B2Feb 25, 2003

MIS semiconductor device with low on resistance and high breakdown voltage

FUJI ELECTRIC CO LTD49 citations92
US6853034B2Feb 8, 2005

Semiconductor device exhibiting a high breakdown voltage and the method of manufacturing the same

FUJI ELECTRIC CO LTD6 citations74
US10388717B2Aug 20, 2019

Resistive element

FUJI ELECTRIC CO LTD2 citations73
US9660014B2May 23, 2017

Semiconductor device

FUJI ELECTRIC CO LTD2 citations73
US10727180B2Jul 28, 2020

Resistive element and method of manufacturing the resistive element

FUJI ELECTRIC CO LTD4 citations72
US6740952B2May 25, 2004

High withstand voltage semiconductor device

FUJI ELECTRIC CO LTD5 citations63
US11276683B2Mar 15, 2022

Semiconductor device, switching power supply control IC, and switching power supply device

FUJI ELECTRIC CO LTD0 citations52
US11189685B2Nov 30, 2021

Resistance element and manufacturing method of resistance element

FUJI ELECTRIC CO LTD0 citations52
US10083953B2Sep 25, 2018

Semiconductor device, control IC for switching power supply, and switching power supply unit

FUJI ELECTRIC CO LTD1 citations52
US9667242B2May 30, 2017

Semiconductor device with serially and spirally connected diodes

FUJI ELECTRIC CO LTD1 citations52
US7195980B2Mar 27, 2007

Semiconductor device exhibiting a high breakdown voltage and the method of manufacturing the same

FUJI ELECTRIC CO LTD0 citations52
US6844598B2Jan 18, 2005

Lateral high breakdown voltage MOSFET and device provided therewith

FUJI ELECTRIC CO LTD1 citations52
US6818954B2Nov 16, 2004

Lateral high breakdown voltage MOSFET and device provided therewith

FUJI ELECTRIC CO LTD0 citations52
US11114351B2Sep 7, 2021

Dummy element and method of examining defect of resistive element

FUJI ELECTRIC CO LTD0 citations51
US9711659B2Jul 18, 2017

Semiconductor device

FUJI ELECTRIC CO LTD1 citations51
US10725087B2Jul 28, 2020

Semiconductor integrated device and gate screening test method of the same

FUJI ELECTRIC CO LTD0 citations50

KISSEI PHARMACEUTICAL

4 patents

MATSUSHITA ELECTRONICS CORP

4 patents

DISCO CORP

4 patents

SAITO MASARU

4 patents

FUJITSU LTD

3 patents

NEC CORP

1 patent

KOBE STEEL LTD

1 patent

FUJI ELECTRIC SYSTEMS CO LTD

1 patent

KABUSHIKI KAISYA TOKYO SHINYA

1 patent

NEO ALA CO LTD

1 patent

FUJI MACHINE MFG

1 patent

(unassigned)

1 patent

NIPPON CHEMICON

1 patent

JUKI KK

1 patent

MIZUSAWA IND CHEMICALS INC

1 patent

FUJI ELECTRIC HOLDINGS

1 patent

TAIYO YUDEN KK

1 patent

OKUMA MACHINERY WORKS LTD

1 patent

FURUKAWA ELECTRIC CO LTD

1 patent

SHOEI ELECTRIC CO LTD

1 patent

Showing the top 50 of 54 patents by PatentIndex Score.