Inventor
KANG DAE-HWAN
KR32 patents
⚠️ This page may combine multiple inventors who share the name “KANG DAE-HWAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
26 patentsUS9941333B2Apr 10, 2018
Memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD23 citations94
US9741764B1Aug 22, 2017
Memory device including ovonic threshold switch adjusting threshold voltage thereof
SAMSUNG ELECTRONICS CO LTD37 citations94
US9716129B1Jul 25, 2017
Memory device and electronic apparatus including the same
SAMSUNG ELECTRONICS CO LTD25 citations93
US7778079B2Aug 17, 2010
Multiple level cell phase-change memory devices having post-programming operation resistance drift saturation, memory systems employing such devices and methods of reading memory devices
SAMSUNG ELECTRONICS CO LTD26 citations92
US7701749B2Apr 20, 2010
Multiple level cell phase-change memory devices having controlled resistance drift parameter, memory systems employing such devices and methods of reading memory devices
SAMSUNG ELECTRONICS CO LTD21 citations92
US7969798B2Jun 28, 2011
Phase change memory devices and read methods using elapsed time-based read voltages
SAMSUNG ELECTRONICS CO LTD40 citations91
US10263040B2Apr 16, 2019
Memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD4 citations84
US9991315B2Jun 5, 2018
Memory device including ovonic threshold switch adjusting threshold voltage thereof
SAMSUNG ELECTRONICS CO LTD7 citations84
US9887354B2Feb 6, 2018
Memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD6 citations84
US10062840B2Aug 28, 2018
Variable resistance memory devices and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD8 citations83
US11201192B2Dec 14, 2021
Memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD1 citations73
US11183538B2Nov 23, 2021
Memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD2 citations73
US10644069B2May 5, 2020
Memory devices having crosspoint memory arrays therein with multi-level word line and bit line structures
SAMSUNG ELECTRONICS CO LTD6 citations73
US10636843B2Apr 28, 2020
Memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD2 citations73
US10566529B2Feb 18, 2020
Memory cell and memory device comprising selection device layer, middle electrode layer and variable resistance layer
SAMSUNG ELECTRONICS CO LTD3 citations73
US10497751B2Dec 3, 2019
Memory device and electronic apparatus including the same
SAMSUNG ELECTRONICS CO LTD4 citations72
US10062841B2Aug 28, 2018
Memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD3 citations72
US11349074B2May 31, 2022
Memory cell and memory device comprising selection device layer, middle electrode layer and variable resistance layer
SAMSUNG ELECTRONICS CO LTD0 citations62
US10615341B2Apr 7, 2020
Semiconductor devices and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD1 citations62
US10249820B2Apr 2, 2019
Semiconductor devices and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD1 citations62
US10580979B2Mar 3, 2020
Memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD1 citations61
US10804466B2Oct 13, 2020
Memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD0 citations52
US10141373B2Nov 27, 2018
Memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD1 citations52
US10734450B2Aug 4, 2020
Memory device and electronic apparatus including the same
SAMSUNG ELECTRONICS CO LTD0 citations51
US10593874B2Mar 17, 2020
Variable resistance memory devices and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD0 citations51
US10546999B2Jan 28, 2020
Variable resistance memory devices and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD0 citations42
KOREA INST SCI & TECH
3 patentsUS7632456B2Dec 15, 2009
Phase change material for high density non-volatile memory
KOREA INST SCI & TECH7 citations71
US7851778B2Dec 14, 2010
Non-volatile electrical phase change memory device comprising interfacial control layer and method for the preparation thereof
KOREA INST SCI & TECH4 citations62
US7851828B2Dec 14, 2010
Phase change memory cell with transparent conducting oxide for electrode contact material
KOREA INST SCI & TECH0 citations52