Inventor
GRADY MATTHEW SEAN
US3 patents
Patents
3 patentsUS6557132B2Apr 29, 2003
Method and system for determining common failure modes for integrated circuits
IBM25 citations85
US7139944B2Nov 21, 2006
Method and system for determining minimum post production test time required on an integrated circuit device to achieve optimum reliability
IBM15 citations79
US6754864B2Jun 22, 2004
System and method to predetermine a bitmap of a self-tested embedded array
IBM7 citations67