Inventor
ANDRESEN JEFFREY
US8 patents
Patents
8 patentsUS10545096B1Jan 28, 2020
Marco inspection systems, apparatus and methods
NANOTRONICS IMAGING INC7 citations82
US10915992B1Feb 9, 2021
System, method and apparatus for macroscopic inspection of reflective specimens
NANOTRONICS IMAGING INC3 citations71
US11995802B2May 28, 2024
System, method and apparatus for macroscopic inspection of reflective specimens
NANOTRONICS IMAGING INC0 citations61
US11663703B2May 30, 2023
System, method and apparatus for macroscopic inspection of reflective specimens
NANOTRONICS IMAGING INC0 citations61
US11656184B2May 23, 2023
Macro inspection systems, apparatus and methods
NANOTRONICS IMAGING INC0 citations61
US11408829B2Aug 9, 2022
Macro inspection systems, apparatus and methods
NANOTRONICS IMAGING INC0 citations61
US11341617B2May 24, 2022
System, method and apparatus for macroscopic inspection of reflective specimens
NANOTRONICS IMAGING INC0 citations61
US10914686B2Feb 9, 2021
Macro inspection systems, apparatus and methods
NANOTRONICS IMAGING INC0 citations61