Inventor · disambiguated record
Scott Waisanen
Also filed as: WAISANEN SCOTT
5 granted patents·364 citations·filing 1998–2003
86Inventor score
Files withPARTICLE MEASURING SYST5
Top patents by PatentIndex Score
5 records- 0194US7208123B2Molecular contamination monitoring system and methodPARTICLE MEASURING SYST·Filed 2002·Granted Apr 24, 2007·76 cites·73 claims
- 0292USRE39783EChemical mechanical planarization (CMP) slurry quality control process and particle size distribution measuring systemsPARTICLE MEASURING SYST·Filed 2003·Granted Aug 21, 2007·47 cites·33 claims
- 0389US7235214B2System and method for measuring molecular analytes in a measurement fluidPARTICLE MEASURING SYST·Filed 2003·Granted Jun 26, 2007·61 cites·21 claims
- 0462US6275290B1Chemical mechanical planarization (CMP) slurry quality control process and particle size distribution measuring systemsPARTICLE MEASURING SYST·Filed 1999·Granted Aug 14, 2001·89 cites·33 claims
- 0562US6246474B1Method and apparatus for measurement of particle size distribution in substantially opaque slurriesPARTICLE MEASURING SYST·Filed 1998·Granted Jun 12, 2001·91 cites·48 claims
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