P

Inventor

COTTE JOHN MICHAEL

US42 patents
⚠️ This page may combine multiple inventors who share the name “COTTE JOHN MICHAEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

38 patents
US6346484B1Feb 12, 2002

Method for selective extraction of sacrificial place-holding material used in fabrication of air gap-containing interconnect structures

IBM80 citations97
US7808798B2Oct 5, 2010

Versatile Si-based packaging with integrated passive components for mmWave applications

IBM27 citations92
US7518229B2Apr 14, 2009

Versatile Si-based packaging with integrated passive components for mmWave applications

IBM31 citations92
US6838015B2Jan 4, 2005

Liquid or supercritical carbon dioxide composition

IBM20 citations92
US6683008B1Jan 27, 2004

Process of removing ion-implanted photoresist from a workpiece

IBM19 citations92
US6622507B2Sep 23, 2003

Electromechanical device and a process of preparing same

IBM27 citations92
US6454869B1Sep 24, 2002

Process of cleaning semiconductor processing, handling and manufacturing equipment

IBM24 citations92
US6451375B1Sep 17, 2002

Process for depositing a film on a nanometer structure

IBM33 citations92
US6429523B1Aug 6, 2002

Method for forming interconnects on semiconductor substrates and structures formed

IBM32 citations92
US6425956B1Jul 30, 2002

Process for removing chemical mechanical polishing residual slurry

IBM44 citations92
US6398875B1Jun 4, 2002

Process of drying semiconductor wafers using liquid or supercritical carbon dioxide

IBM53 citations92
US6013713AJan 11, 2000

Electrode modification using an unzippable polymer paste

IBM18 citations92
US5800726ASep 1, 1998

Selective chemical etching in microelectronics fabrication

IBM45 citations92
US7422983B2Sep 9, 2008

Ta-TaN selective removal process for integrated device fabrication

IBM16 citations91
US7863189B2Jan 4, 2011

Methods for fabricating silicon carriers with conductive through-vias with low stress and low defect density

IBM32 citations90
US6468413B1Oct 22, 2002

Electrochemical etch for high tin solder bumps

IBM19 citations88
US6834671B2Dec 28, 2004

Check valve for micro electro mechanical structure devices

IBM19 citations84
US6281105B1Aug 28, 2001

Electrode modification using an unzippable polymer paste

IBM14 citations82
US6890855B2May 10, 2005

Process of removing residue material from a precision surface

IBM9 citations74
US6457480B1Oct 1, 2002

Process and apparatus for cleaning filters

IBM9 citations74
US6258703B1Jul 10, 2001

Reflow of low melt solder tip C4's

IBM8 citations74
US6221503B1Apr 24, 2001

Electrode modification using an unzippable polymer paste

IBM5 citations74
US7192868B2Mar 20, 2007

Method of obtaining release-standing micro structures and devices by selective etch removal of protective and sacrificial layer using the same

IBM7 citations73
US6570255B2May 27, 2003

Method for forming interconnects on semiconductor substrates and structures formed

IBM7 citations73
US6739346B2May 25, 2004

Apparatus for cleaning filters

IBM4 citations63
US6653233B2Nov 25, 2003

Process of providing a semiconductor device with electrical interconnection capability

IBM6 citations63
US6579464B2Jun 17, 2003

Fixtures for processing a workpiece in a supercritical fluid

IBM4 citations63
US12150390B2Nov 19, 2024

Downstop and bump bonds formation on substrates

IBM0 citations62
US12033981B2Jul 9, 2024

Create a protected layer for interconnects and devices in a packaged quantum structure

IBM0 citations62
US11908756B2Feb 20, 2024

Interposer chips and enclosures for quantum circuits

IBM1 citations62
US11804442B2Oct 31, 2023

Combined backing plate and housing for use in bump bonded chip assembly

IBM0 citations62
US11676903B2Jun 13, 2023

Combined backing plate and housing for use in bump bonded chip assembly

IBM0 citations62
US12324361B2Jun 3, 2025

Electrical connections between dissimilar materials at cryogenic temperatures

IBM0 citations61
US12249748B2Mar 11, 2025

Edge capacitive coupling for quantum chips

IBM0 citations61
US12557210B2Feb 17, 2026

Electronic apparatus minimizing differential thermal contraction for cryogenic quantum computers

IBM0 citations58
US7332436B2Feb 19, 2008

Process of removing residue from a precision surface using liquid or supercritical carbon dioxide composition

IBM0 citations51
US10199516B2Feb 5, 2019

Method for fabricating a photovoltaic device by uniform plating on dielectric passivated through-wafer vias and interconnects

IBM0 citations43
US9716192B2Jul 25, 2017

Method for fabricating a photovoltaic device by uniform plating on emitter-lined through-wafer vias and interconnects

IBM0 citations43

COTTE JOHN MICHAEL

4 patents