Inventor
COTTE JOHN MICHAEL
US42 patents
⚠️ This page may combine multiple inventors who share the name “COTTE JOHN MICHAEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
38 patentsUS6346484B1Feb 12, 2002
Method for selective extraction of sacrificial place-holding material used in fabrication of air gap-containing interconnect structures
IBM80 citations97
US7808798B2Oct 5, 2010
Versatile Si-based packaging with integrated passive components for mmWave applications
IBM27 citations92
US7518229B2Apr 14, 2009
Versatile Si-based packaging with integrated passive components for mmWave applications
IBM31 citations92
US6838015B2Jan 4, 2005
Liquid or supercritical carbon dioxide composition
IBM20 citations92
US6683008B1Jan 27, 2004
Process of removing ion-implanted photoresist from a workpiece
IBM19 citations92
US6622507B2Sep 23, 2003
Electromechanical device and a process of preparing same
IBM27 citations92
US6454869B1Sep 24, 2002
Process of cleaning semiconductor processing, handling and manufacturing equipment
IBM24 citations92
US6451375B1Sep 17, 2002
Process for depositing a film on a nanometer structure
IBM33 citations92
US6429523B1Aug 6, 2002
Method for forming interconnects on semiconductor substrates and structures formed
IBM32 citations92
US6425956B1Jul 30, 2002
Process for removing chemical mechanical polishing residual slurry
IBM44 citations92
US6398875B1Jun 4, 2002
Process of drying semiconductor wafers using liquid or supercritical carbon dioxide
IBM53 citations92
US6013713AJan 11, 2000
Electrode modification using an unzippable polymer paste
IBM18 citations92
US5800726ASep 1, 1998
Selective chemical etching in microelectronics fabrication
IBM45 citations92
US7422983B2Sep 9, 2008
Ta-TaN selective removal process for integrated device fabrication
IBM16 citations91
US7863189B2Jan 4, 2011
Methods for fabricating silicon carriers with conductive through-vias with low stress and low defect density
IBM32 citations90
US6468413B1Oct 22, 2002
Electrochemical etch for high tin solder bumps
IBM19 citations88
US6834671B2Dec 28, 2004
Check valve for micro electro mechanical structure devices
IBM19 citations84
US6281105B1Aug 28, 2001
Electrode modification using an unzippable polymer paste
IBM14 citations82
US6890855B2May 10, 2005
Process of removing residue material from a precision surface
IBM9 citations74
US6457480B1Oct 1, 2002
Process and apparatus for cleaning filters
IBM9 citations74
US6258703B1Jul 10, 2001
Reflow of low melt solder tip C4's
IBM8 citations74
US6221503B1Apr 24, 2001
Electrode modification using an unzippable polymer paste
IBM5 citations74
US7192868B2Mar 20, 2007
Method of obtaining release-standing micro structures and devices by selective etch removal of protective and sacrificial layer using the same
IBM7 citations73
US6570255B2May 27, 2003
Method for forming interconnects on semiconductor substrates and structures formed
IBM7 citations73
US6739346B2May 25, 2004
Apparatus for cleaning filters
IBM4 citations63
US6653233B2Nov 25, 2003
Process of providing a semiconductor device with electrical interconnection capability
IBM6 citations63
US6579464B2Jun 17, 2003
Fixtures for processing a workpiece in a supercritical fluid
IBM4 citations63
US12150390B2Nov 19, 2024
Downstop and bump bonds formation on substrates
IBM0 citations62
US12033981B2Jul 9, 2024
Create a protected layer for interconnects and devices in a packaged quantum structure
IBM0 citations62
US11908756B2Feb 20, 2024
Interposer chips and enclosures for quantum circuits
IBM1 citations62
US11804442B2Oct 31, 2023
Combined backing plate and housing for use in bump bonded chip assembly
IBM0 citations62
US11676903B2Jun 13, 2023
Combined backing plate and housing for use in bump bonded chip assembly
IBM0 citations62
US12324361B2Jun 3, 2025
Electrical connections between dissimilar materials at cryogenic temperatures
IBM0 citations61
US12249748B2Mar 11, 2025
Edge capacitive coupling for quantum chips
IBM0 citations61
US12557210B2Feb 17, 2026
Electronic apparatus minimizing differential thermal contraction for cryogenic quantum computers
IBM0 citations58
US7332436B2Feb 19, 2008
Process of removing residue from a precision surface using liquid or supercritical carbon dioxide composition
IBM0 citations51
US10199516B2Feb 5, 2019
Method for fabricating a photovoltaic device by uniform plating on dielectric passivated through-wafer vias and interconnects
IBM0 citations43
US9716192B2Jul 25, 2017
Method for fabricating a photovoltaic device by uniform plating on emitter-lined through-wafer vias and interconnects
IBM0 citations43
COTTE JOHN MICHAEL
4 patentsUS8796138B2Aug 5, 2014
Through substrate vias
COTTE JOHN MICHAEL2 citations62
US8263492B2Sep 11, 2012
Through substrate vias
COTTE JOHN MICHAEL4 citations62
US8338920B2Dec 25, 2012
Package integrated soft magnetic film for improvement in on-chip inductor performance
COTTE JOHN MICHAEL2 citations61
US8426316B2Apr 23, 2013
Ta-TaN selective removal process for integrated device fabrication
COTTE JOHN MICHAEL4 citations60