Inventor · disambiguated record
Mark Bunn
Also filed as: BUNN MARK
4 granted patents·274 citations·filing 1992–2005
82Inventor score
Files withMICRON TECHNOLOGY INC4
Top patents by PatentIndex Score
4 records- 0189US5461328AFixture for burn-in testing of semiconductor wafersMICRON TECHNOLOGY INC·Filed 1993·Granted Oct 24, 1995·107 cites·4 claims
- 0289US5279975AMethod of testing individual dies on semiconductor wafers prior to singulationMICRON TECHNOLOGY INC·Filed 1992·Granted Jan 18, 1994·117 cites·13 claims
- 0372US7274201B2Method and system for stressing semiconductor wafers during burn-inMICRON TECHNOLOGY INC·Filed 2005·Granted Sep 25, 2007·8 cites·29 claims
- 0472US5391892ASemiconductor wafers having test circuitry for individual diesMICRON TECHNOLOGY INC·Filed 1993·Granted Feb 21, 1995·42 cites·11 claims
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