Inventor
WAHAWISAN WEERAKIAT
US5 patents
Patents
5 patentsUS6118540ASep 12, 2000
Method and apparatus for inspecting a workpiece
SEMICONDUCTOR TECH & INSTR INC99 citations95
US5956134ASep 21, 1999
Inspection system and method for leads of semiconductor devices
SEMICONDUCTOR TECH & INSTR INC68 citations91
US6765666B1Jul 20, 2004
System and method for inspecting bumped wafers
SEMICONDUCTOR TECH & INSTR INC18 citations87
US5745593AApr 28, 1998
Method and system for inspecting integrated circuit lead burrs
SEMICONDUCTOR TECH & INSTR INC16 citations71
US5777886AJul 7, 1998
Programmable lead conditioner
SEMICONDUCTOR TECH & INSTR INC10 citations67