Inventor
CONDON KEVIN L
US3 patents
Patents
3 patentsUS6788093B2Sep 7, 2004
Methodology and apparatus using real-time optical signal for wafer-level device dielectrical reliability studies
IBM131 citations93
US7202689B2Apr 10, 2007
Sensor differentiated fault isolation
IBM8 citations71
US7397263B2Jul 8, 2008
Sensor differentiated fault isolation
IBM5 citations60