Inventor
DEE-NOOR BARAK
IL3 patents
Patents
3 patentsUS10103005B2Oct 16, 2018
Imaging low electron yield regions with a charged beam imager
APPLIED MATERIALS ISRAEL LTD0 citations47
US10288409B2May 14, 2019
Temperature sensitive location error compensation
APPLIED MATERIALS ISRAEL LTD0 citations33
US10074512B2Sep 11, 2018
System and method for setting a temperature of an object within a chamber
APPLIED MATERIALS ISRAEL LTD0 citations31