Inventor
BANG DAVID
US14 patents
⚠️ This page may combine multiple inventors who share the name “BANG DAVID”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANCED MICRO DEVICES INC
8 patentsUS5949143ASep 7, 1999
Semiconductor interconnect structure with air gap for reducing intralayer capacitance in metal layers in damascene metalization process
ADVANCED MICRO DEVICES INC101 citations97
US6268277B1Jul 31, 2001
Method of producing air gap for reducing intralayer capacitance in metal layers in damascene metalization process and product resulting therefrom
ADVANCED MICRO DEVICES INC59 citations95
US6169039B1Jan 2, 2001
Electron bean curing of low-k dielectrics in integrated circuits
ADVANCED MICRO DEVICES INC41 citations92
US6127193AOct 3, 2000
Test structure used to measure metal bottom coverage in trenches and vias/contacts and method for creating the test structure
ADVANCED MICRO DEVICES INC41 citations92
US6047243AApr 4, 2000
Method for quantifying ultra-thin dielectric reliability: time dependent dielectric wear-out
ADVANCED MICRO DEVICES INC38 citations92
US5953625ASep 14, 1999
Air voids underneath metal lines to reduce parasitic capacitance
ADVANCED MICRO DEVICES INC30 citations92
US6380556B1Apr 30, 2002
Test structure used to measure metal bottom coverage in trenches and vias/contacts and method for creating the test structure
ADVANCED MICRO DEVICES INC3 citations63
US6274915B1Aug 14, 2001
Method of improving MOS device performance by controlling degree of depletion in the gate electrode
ADVANCED MICRO DEVICES INC6 citations62