Inventor

BAK JUNG-HOON

KR7 patents

⚠️ This page may combine multiple inventors who share the name “BAK JUNG-HOON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

6 patents

US10833250B2Nov 10, 2020

Magnetoresistive random access memory device and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD5 citations82

US10043966B2Aug 7, 2018

Semiconductor device including via plugs

SAMSUNG ELECTRONICS CO LTD5 citations69

US11462679B2Oct 4, 2022

Magnetoresistive random access memory device and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD0 citations60

US12282317B2Apr 22, 2025

Wafer defect test apparatus, wafer defect test system, wafer test method and fabrication method of a wafer

SAMSUNG ELECTRONICS CO LTD0 citations48

US10355200B2Jul 16, 2019

Semiconductor device and electronic system including the same

SAMSUNG ELECTRONICS CO LTD0 citations48

US10109676B2Oct 23, 2018

MTJ structures including magnetism induction pattern and magnetoresistive random access memory devices including the same

SAMSUNG ELECTRONICS CO LTD0 citations48

BAK JUNG HOON

1 patent

US10056543B2Aug 21, 2018

Magnetoresistive random access memory device having magnetic tunnel junction and method of manufacturing the same

BAK JUNG HOON10 citations78