Inventor

HENSTRA ALEXANDER

NL47 patents

⚠️ This page may combine multiple inventors who share the name “HENSTRA ALEXANDER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HENSTRA ALEXANDER

FEI CO

Particle-optical appliance provided with aberration-correcting means

SEM provided with an electrostatic objective and an electrical scanning device

Particle source with selectable beam current and energy spread

Charged particle source with integrated energy filter

Dual beam microscope system for imaging during sample processing

Beam pulsing device for use in charged-particle microscopy

Transmission charged particle microscope with improved EELS/EFTEM module

Post column filter with enhanced energy range

Gun lens design in a charged particle microscope

Electron diffraction holography

Electron diffraction holography

Sixth-order and above corrected STEM multipole correctors

Charged-particle microscope with astigmatism compensation and energy-selection

EELS auto-alignment using full image simulation

Reduction of thermal magnetic field noise in TEM corrector systems

Methods and systems for acquiring 3D diffraction data

Reduction of thermal magnetic field noise in TEM corrector systems

Corrector transfer optics for Lorentz EM

Bifocal electron microscope

Simultaneous TEM and STEM microscope

Charged particle optics components and their fabrication

Method and system for correcting two-fold, fifth-order parasitic aberrations in charged particle systems

System and method for reducing the charging effect in a transmission electron microscope system

Methods and systems for acquiring three-dimensional electron diffraction data

Post column filter with enhanced energy range

Magnetic field free sample plane for charged particle microscope

Simple spherical aberration corrector for SEM

Simple spherical aberration corrector for SEM

Focused ion beam system and method

Energy spectrometer with dynamic focus

Electron optical module for providing an off-axial electron beam with a tunable coma

Aberration measurement in a charged particle microscope

Method of using an environmental transmission electron microscope

PHILIPS CORP

Correction device for correcting chromatic aberration in particle-optical apparatus

Particle-optical apparatus comprising a detector for secondary electrons

Correction device for the correction of lens aberrations in particle-optical apparatus

Method of operating a particle-optical apparatus

Particle-optical instrument comprising a deflection unit for secondary electrons

HENSTRA ALEXANDER

Charged particle source with integrated energy filter

Corrector for axial aberrations of a particle-optical lens

Charged particle source with integrated electrostatic energy filter

Corrector for the correction of chromatic aberrations in a particle-optical apparatus

KONINKL PHILIPS ELECTRONICS NV

Particle-optical apparatus involving detection of Auger electronics

PHILIPS ELECTRON OPTICS BV

Electrostatic device for correcting chromatic aberration in a particle-optical apparatus

TOTH MILOS

Charged particle beam processing

BISCHOFF MAARTEN

Distortion free stigmation of a TEM

FEI COMPANY

FIB and SEM resolution enhancement using asymmetric probe deconvolution