Inventor · disambiguated record

Wei Hsiung Hsu

Also filed as: HSU WEI HSIUNG

1 granted patent·0 citations·filing 2003–2003

8Inventor score

Technology areasH10D

Files withTAIWAN SEMICONDUCTOR MFG1

Top patents by PatentIndex Score

1 record

0125US7214551B2Multiple gate electrode linewidth measurement and photoexposure compensation methodTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted May 8, 2007·0 cites·20 claims

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