Inventor · disambiguated record

Fayik Bundhoo

Also filed as: BUNDHOO FAYIK

1 granted patent·1 citations·filing 2008–2008

16Inventor score

Technology areasG01R

Files withNAT SEMICONDUCTGOR1

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1 record

0137US7928748B2Method of locating failure site on semiconductor device under testNAT SEMICONDUCTGOR·Filed 2008·Granted Apr 19, 2011·1 cites·16 claims

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