Inventor

VAEZ-IRAVANI MEHDI

US109 patents

⚠️ This page may combine multiple inventors who share the name “VAEZ-IRAVANI MEHDI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

VAEZ-IRAVANI MEHDI

KLA TENCOR TECH CORP

Surface inspection system using laser line illumination with two dimensional imaging

High-speed electron beam inspection

Process for identifying defects in a substrate having non-uniform surface properties

Metrology system using optical phase

Systems for inspection of patterned or unpatterned wafers and other specimen

Method and system using exposure control to inspect a surface

Methods and apparatus for inspecting a sample

Simultaneous multi-spot inspection and imaging

Defect detection system

Stabilizing a substrate using a vacuum preload air bearing chuck

System for detecting anomalies and/or features of a surface

Systems and method for simultaneously inspecting a specimen with two distinct channels

Fourier filters and wafer inspection systems

Sample inspection system

Simultaneous multi-spot inspection and imaging

Systems and methods for a wafer inspection system using multiple angles and multiple wavelength illumination

Systems and methods for simultaneous or sequential multi-perspective specimen defect inspection

Illumination apparatus and methods

Sample inspection system

Multi-spot illumination and collection optics for highly tilted wafer planes

Systems and methods for a wafer inspection system using multiple angles and multiple wavelength illumination

Optical system for detecting anomalies and/or features of surfaces

KLA TENCOR CORP

Sample inspection system

System for detecting anomalies and/or features of a surface

Massively parallel inspection and imaging system

Sample inspection system

Single laser bright field and dark field system for detecting anomalies of a sample

Sample inspection system

Sample inspection system

Sample inspection system

Detecting and repairing defects of photovoltaic devices

Massively parallel inspection and imaging system

Wafer inspection

Systems and methods for inspecting wafers

Sample inspection system

Segmented optical and electrical testing for photovoltaic devices

Defect detection system

Defect detection using time delay lock-in thermography (LIT) and dark field LIT

Apparatus and methods for inspecting extreme ultra violet reticles

Inspection system for integrated applications

ZHAO GUOHENG

Wafer inspection

Multi-spot scanning system and method

Dark field inspection system with ring illumination

LED solar illuminator

VAEZ-IRAVANI MEHDI

Systems and methods for inspection of a specimen

Enhanced focusing capability on a sample using a spot matrix

APPLIED MATERIALS INC

In-situ, real-time detection of particulate defects in a fluid

Method and apparatus for reducing radiation induced change in semiconductor structures

IBM

Feedback controlled differential fiber interferometer

ROMANOVSKY ANATOLY

Wafer inspection