Inventor

GE HAN CHENG

SG6 patents

⚠️ This page may combine multiple inventors who share the name “GE HAN CHENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

AMANULLAH AJHARALI

2 patents

US9863889B2Jan 9, 2018

System and method for inspecting a wafer

AMANULLAH AJHARALI4 citations69

US10161881B2Dec 25, 2018

System and method for inspecting a wafer

AMANULLAH AJHARALI1 citations46

ASTI HOLDINGS LTD

2 patents

US7869021B2Jan 11, 2011

Multiple surface inspection system and method

ASTI HOLDINGS LTD2 citations54

US7768633B2Aug 3, 2010

Multiple surface inspection system and method

ASTI HOLDINGS LTD1 citations44

SEMICONDUCTOR TECH & INSTRUMENTS PTE LTD

1 patent

US10876975B2Dec 29, 2020

System and method for inspecting a wafer

SEMICONDUCTOR TECH & INSTRUMENTS PTE LTD4 citations69

Generic Power Ptd Ltd

1 patent

US10151580B2Dec 11, 2018

Methods of inspecting a 3D object using 2D image processing

Generic Power Ptd Ltd1 citations38