Inventor

ISHITANI TOHRU

JP70 patents

⚠️ This page may combine multiple inventors who share the name “ISHITANI TOHRU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ISHITANI TOHRU

HITACHI LTD

Method and apparatus for specimen fabrication

Method for separating specimen and method for analyzing the specimen separated by the specimen separating method

Apparatus for detecting defect in device and method of detecting defect

Projecting type charged particle microscope and projecting type substrate inspection system

Method for making specimen and apparatus thereof

Method of manufacturing devices having superlattice structures

Ion beam apparatus and sample processing method

Method and apparatus for specimen fabrication

Narrow track thin film magnetic head suitable for high density recording and reproducing operations and fabrication method thereof wherein an air bearing surface has at least one groove containing a non-magnetic electrically conductive layer

Device having superlattice structure, and method of and apparatus for manufacturing the same

Ion-beam machining method and apparatus

Liquid metal ion source

Image evaluation method and microscope

Apparatus and method for observing sample using electron beam

Liquid metal ion source with high temperature cleaning apparatus for cleaning the emitter and reservoir

Ion micro beam apparatus

Ion microbeam apparatus

Apparatus for implanting ion microbeam

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Ion beam apparatus and sample processing method

Combination perpendicular magnetic head having shield material formed at both ends of an upper pole of a write element

Method of fabricating a magnetic head by focused ion beam etching

Methods for device transplantation

Charged particle beam apparatus

Focused ion beam machining method and focused ion beam machining apparatus

Scanning charged-particle microscope

Specimen or substrate cutting method using focused charged particle beam and secondary ion spectroscopic analysis method utilizing the cutting method

Liquid metal ion source

Image evaluation method and microscope

Narrow track thin film head including magnetic poles machined by focused ion beam etching

Narrow track thin film head having a focused ion beam etched air bearing surface

Narrow track thin film magnetic head suitable for high density recording and reproducing operations and fabrication method thereof wherein an air bearing surface has at least one groove containing a non-magnetic electrically conductive layer

Liquid metal ion source with pulse generator control

Liquid metal ion source

Apparatus for irradiation with charged particle beams

Source of charged particles beam

Ion-electron analyzer

HITACHI HIGH TECH CORP

Liquid metal ion gun

Charged particle beam apparatus and sample manufacturing method

Liquid metal ion gun

Focused ion beam apparatus and focused ion beam irradiation method

Methods for sample preparation and observation, charged particle apparatus

Liquid metal ion gun

HITACHI ULSI SYS CO LTD

Probe driving method, and probe apparatus

Apparatus for inspecting defects of devices and method of inspecting defects

SHICHI HIROYASU

Ion beam device

Gas field ion source, charged particle microscope, and apparatus

(unassigned)

Focused ion beam apparatus and method for irradiating focused ion beam

Observation method and apparatus for removing an oxidation layer and forming an image from a sample